Datasheet

MPL
Metallized polypropylene lm capacitor
MKP - Low Dissipation - Precision
Ed.03 Rev.00 07.2012
10.1
Main applications
Filtering, timing, integrating circuits, high performance and high
precision circuits. Low pulse operation
Dielectric
Polypropylene
Electrodes
Vacuum deposited metal layers
Coating
UL 510 / CSA TIL I-26 polyester tape wrapping; UL 94 V-0 resin end
ll (ame retardant execution)
Construction
Extended metallized lm (refer to general technical information)
Terminals
Tinned copper wire (Lead free)
Reference standard
IEC 60384/16, IEC 60068, RoHS compliant
Climatic category
55/85/56 (IEC 60068/1), FME (DIN40040)
Operating temperature range
-55°...+85°C
Rated capacitance (Cr)
1000pF to 4,7μF, in compliance with IEC60063. Refer to article
table
Capacitance code
The four digits indicating the capacitance code are used as
follows:
1st digit = number of zero to be added to the three signicant
gures of the capacitance value expressed in pF
2nd, 3rd and 4th digit = the three signicant gures of the
capacitance value
Examples: 2740 pF = 1274; 0.56 μF = 560000 pF = 3560; 1.21 μF
= 1210000 pF = 4121
Capacitance tolerance (at 1kHz)
±1% (code=F), ±1,25% (code=A) , ±2% (code=G), ±2,5%
(code=H); ±3% (code=I)
Capacitance temperature coefcient
Refer to graphs in general technical information
Long term stability (at 1 kHz)
Capacitance variation ≤ ±0,5% after a period of 2 years at standard
environmental conditions
Rated voltage (Ur)
160, 250, 400, 630 Vdc
(Permissible AC voltage at 60Hz: 90, 200, 220, 250 Vac)
Category voltage (Uc)
UC=Ur at +85°C
Self inductance
≤ 1nH/mm of capacitor and leads length used for connection
Maximum pulse rise time
Refer to article table. The pulse characteristic Ko depends on the
voltage waveform. In any case the value given in the article table
must not be exceeded
Dissipation factor (DF), max.
tgδ x10
-4
, measured at 25±5°C
Freq. Cr≤0.1μF 0.1μF<Cr≤1μF Cr>1μF
1kHz 6 6 6
10kHz 10 20 -
100kHz 30 -
Insulation resistance (IR)
Measured between terminals, at 25±°C, after 1 minute of
electrication at 100Vdc
Cr IR
≤ 0,33µF ≥ 100GΩ
> 0,33µF ≥ 30000s
Test voltage between terminals (Ut)
1,6xUr (DC) applied for 2s at 25±5°C (1 minute for type test)
Damp heat test (steady state)
Test conditions:
Temperature= +40±2°C
Relative humidity=93±2%
Test duration= 56 days
Performance:
Capacitance change ≤ ±1%
DF change ≤ 0.0010 at 10kHz for Cr ≤ 1μF
DF change ≤ 0.0010 at 1kHz for Cr > 1µF
IR≥ 50% of initial limit value
Endurance test
Test conditions:
Temperature= +85±2°C
Test duration= 2000h
Voltage applied=1,25xUr(DC)
Performance:
Capacitance change ≤ ±1%
DF change ≤ 0.0010 at 10kHz for Cr ≤ 1μF
DF change ≤ 0.0010 at 1kHz for Cr > 1µF
IR≥ 50% of initial limit value
Resistance to soldering heat test
Test conditions:
Solder bath temperature= +260±5°C
Dipping time (with heat screen)= 10±1s
Performance:
Capacitance change ≤ ±0,25%
DF change ≤ 0.0010 at 10kHz for Cr ≤ 1μF
DF change ≤ 0.0010 at 1kHz for Cr > 1µF
IR≥ 50% of initial limit value
Reliability (MIL HDB 217)
Application conditions:
Applied voltage= 0,5 x Ur(DC)
Temperature= +40±2°C
Failure rate:
(1FIT=1x10
-9
failures/components x hours)
≤ 3FIT for all the values
Failure criteria (DIN44122):
Capacitance change > ±10%
DF change > 2 x initial value
IR< 0,005 x initial limit value
Short or open circuit
Warning: this specication must be completed with the data given in the
“General technical information” chapter