Datasheet

TLE6251D
General Product Characteristics
Data Sheet 16 Rev. 1.0, 2012-07-27
6 General Product Characteristics
6.1 Absolute Maximum Ratings
Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous repetitive operation.
Table 3 Absolute Maximum Ratings Voltages, Currents and Temperatures
1)
All voltages with respect to ground; positive current flowing into pin
(unless otherwise specified)
1) Not subject to production test, specified by design
Pos. Parameter Symbol Limit Values Unit Remarks
Min. Max.
Voltages
6.1.1 Supply voltage
V
CC
-0.3 6.0 V –
6.1.2 Logic supply voltage
V
IO
-0.3 6.0 V –
6.1.3 CANH DC voltage versus GND
V
CANH
-40 40 V –
6.1.4 CANL DC voltage versus GND
V
CANL
-40 40 V –
6.1.5 Differential voltage between CANH
and CANL
V
CAN diff
-40 40 V –
6.1.6 Logic voltages at logic input pins STB,
TxD
V
Max_in
-0.3 6.0 V –
6.1.7 Logic voltages at logic output pin RxD
V
Max_Out
-0.3 V
IO
V–
Temperatures
6.1.8 Junction temperature
T
j
-40 150 °C–
6.1.9 Storage temperature
T
S
-55 150 °C–
ESD Resistivity
6.1.10 ESD immunity at CANH, CANL
versus GND
V
ESD_HBM_
CAN
-8 8 kV HBM
(100pF via 1.5 kΩ)
2)
2) ESD susceptibility, Human Body Model “HBM” according to ANSI/ESDA/JEDEC JS-001
6.1.11 ESD immunity at all other pins V
ESD_HBM_
All
-2 2 kV HBM
(100pF via 1.5 kΩ)
2)
6.1.12 ESD immunity to GND V
ESD_CDM
-750 750 V CDM
3)
3) ESD susceptibility, Charge Device Model “CDM” according to EIA/JESD22-C101 or ESDA STM5.3.1