Intel® Core™2 Duo Processor, Intel® Pentium® Dual Core Processor, and Intel® Celeron® Dual-Core Processor Thermal and Mechanical Design Guidelines Supporting the: - Intel® Core™2 Duo Processor E6000 and E4000 Series - Intel® Pentium® Dual Core Processor E2000 Series - Intel® Celeron® Dual-Core Processor E1000 Series June 2009 Document Number: 317804-011
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Contents 1 Introduction ...................................................................................................11 1.1 1.2 1.3 2 Processor Thermal/Mechanical Information .........................................................15 2.1 2.2 2.3 2.4 2.5 3 Mechanical Requirements ......................................................................15 2.1.1 Processor Package ................................................................... 15 2.1.2 Heatsink Attach ...........................
.2.10 4.2.11 5 Balanced Technology Extended (BTX) Thermal/Mechanical Design Information ........ 41 5.1 5.2 5.3 5.4 5.5 5.6 6 6.3 6.4 6.5 6.6 6.7 7.2 7.3 7.4 Intel® QST Algorithm ............................................................................69 7.1.1 Output Weighting Matrix ..........................................................70 7.1.2 Proportional-Integral-Derivative (PID) ........................................ 70 Board and System Implementation of Intel® QST ...................
A.3 Appendix B B.3 Bond Line Management .........................................................................87 Interface Material Area..........................................................................87 Interface Material Performance...............................................................87 Case Temperature Reference Metrology.............................................................. 89 D.1 D.2 D.3 D.4 D.5 D.6 Appendix E Overview .................................................
Figures Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 6 2-1. 2-2. 2-3. 3-1. 3-2. Package IHS Load Areas ..................................................................15 Processor Case Temperature Measurement Location ...................
Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 7-21. 7-22. 7-23. 7-24. 7-25. 7-26. 7-27. 7-28. 7-29. 7-30. 7-31. 7-32. 7-33. 7-34. 7-35. 7-36. 7-37. 7-38. 7-39. 7-40. 7-41. 7-42. 7-43. 7-44. 7-45. 7-46. 7-47. Figure 7-48. Figure 7-49. Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure Figure 7-50. 7-51. 7-52. 7-53. 7-54.
Tables Table 2-1. Heatsink Inlet Temperature of Intel Reference Thermal Solutions............ 24 Table 2-2. Heatsink Inlet Temperature of Intel Boxed Processor Thermal Solutions ... 24 Table 5-1. Balanced Technology Extended (BTX) Type II Reference TMA Performance ...................................................................................42 Table 5-2. Acoustic Targets ..............................................................................43 Table 5-3. VR Airflow Requirements..................
Revision History Revision Number -001 Description Revision Date Initial release. ® July 2007 -002 Added Intel -003 Added Intel® Pentium® Dual Core processor E2180 specifications -004 Core™2 Duo Desktop processor E4400 at Tc-max of 73.3 °C. Added Intel® Pentium® Dual Core processor E2160 and E2140 at Tc-max of 73.
Thermal and Mechanical Design Guidelines
Introduction 1 Introduction 1.1 Document Goals and Scope 1.1.1 Importance of Thermal Management The objective of thermal management is to ensure that the temperatures of all components in a system are maintained within their functional temperature range. Within this temperature range, a component is expected to meet its specified performance. Operation outside the functional temperature range can degrade system performance, cause logic errors or cause component and/or system damage.
Introduction 1.1.3 Document Scope This design guide supports the following processors: Intel® Core™2 Duo processor with 4 MB cache at Tc-max of 60.1 °C applies to Intel® Core™2 Duo processors E6700, E6600, E6420 and E6320 Intel® Core™2 Duo processor with 4 MB cache at Tc-max of 72.0 °C applies to Intel® Core™2 Duo processors E6850, E6750, E6550 and E6540 Intel® Core™2 Duo processor with 2 MB cache of Tc-max of 72.
Introduction 1.2 References Material and concepts available in the following documents may be beneficial when reading this document. Document Location Intel® Core™2 Extreme Processor X6800 and Intel® Core™2 Duo Desktop Processor E6000 and E4000 Series Datasheet http://intel.com /design/processor/datashts/3132 78.htm Intel® Pentium® Dual-Core Desktop Processor E2000 Series Datasheet www.intel.com//design/processor /datashts/316981.
Introduction Term SA Description Sink-to-ambient thermal characterization parameter. A measure of heatsink thermal performance using total package power. Defined as (TS – TA) / Total Package Power. Note: Heat source must be specified for measurements. TIM Thermal Interface Material: The thermally conductive compound between the heatsink and the processor case. This material fills the air gaps and voids, and enhances the transfer of the heat from the processor case to the heatsink.
Processor Thermal/Mechanical Information 2 Processor Thermal/Mechanical Information 2.1 Mechanical Requirements 2.1.1 Processor Package The processors covered in the document are packaged in a 775-Land LGA package that interfaces with the motherboard using a LGA775 socket. Refer to the datasheet for detailed mechanical specifications. The processor connects to the motherboard through a land grid array (LGA) surface mount socket.
Processor Thermal/Mechanical Information The primary function of the IHS is to transfer the non-uniform heat distribution from the die to the top of the IHS, out of which the heat flux is more uniform and spread over a larger surface area (not the entire IHS area). This allows more efficient heat transfer out of the package to an attached cooling device. The top surface of the IHS is designed to be the interface for contacting a heatsink.
Processor Thermal/Mechanical Information 2.1.2 Heatsink Attach 2.1.2.1 General Guidelines There are no features on the LGA775 socket to directly attach a heatsink: a mechanism must be designed to attach the heatsink directly to the motherboard.
Processor Thermal/Mechanical Information 2.1.2.3 Additional Guidelines In addition to the general guidelines given above, the heatsink attach mechanism for the processor should be designed to the following guidelines: Holds the heatsink in place under mechanical shock and vibration events and applies force to the heatsink base to maintain desired pressure on the thermal interface material.
Processor Thermal/Mechanical Information Figure 2-2. Processor Case Temperature Measurement Location Measure TC at this point (geometric center of the package) 37.5 mm 2.2.2 Thermal Profile The Thermal Profile defines the maximum case temperature as a function of processor power dissipation. The TDP and Maximum Case Temperature are defined as the maximum values of the thermal profile.
Processor Thermal/Mechanical Information Section 3.1). The intercept on the thermal profile assumes a maximum ambient operating condition that is consistent with the available chassis solutions. To determine compliance to the thermal profile, a measurement of the actual processor power dissipation is required. The measured power is plotted on the Thermal Profile to determine the maximum case temperature. Using the example in Figure 2-3 for the Intel® Core™2 Duo processor with 4 MB cache at Tc-max of 60.
Processor Thermal/Mechanical Information TCONTROL will dissipate more power than a part with lower value (farther from 0, e.g., more negative number) of TCONTROL when running the same application. This is achieved in part by using the CA vs. RPM and RPM vs. Acoustics (dBA) performance curves from the Intel enabled thermal solution. A thermal solution designed to meet the thermal profile would be expected to provide similar acoustic performance of different parts with potentially different TCONTROL values.
Processor Thermal/Mechanical Information Passive heatsink solutions require in-depth knowledge of the airflow in the chassis. Typically, passive heatsinks see lower air speed. These heatsinks are therefore typically larger (and heavier) than active heatsinks due to the increase in fin surface required to meet a required performance.
Processor Thermal/Mechanical Information The recommended maximum heatsink mass for the ATX thermal solution is 550g. This mass includes the fan and the heatsink only. The attach mechanism (clip, fasteners, etc.) are not included. The mass limit for BTX heatsinks that use Intel reference design structural ingredients is 900 grams. The BTX structural reference component strategy and design is reviewed in depth in the latest version of the Balanced Technology Extended (BTX) System Design Guide.
Processor Thermal/Mechanical Information 2.4 System Thermal Solution Considerations 2.4.1 Chassis Thermal Design Capabilities The Intel reference thermal solutions and Intel Boxed Processor thermal solutions assume that the chassis delivers a maximum TA at the inlet of the processor fan heatsink. The following tables show the TA requirements for the reference solutions and Intel Boxed Processor thermal solutions. Table 2-1.
Processor Thermal/Mechanical Information In addition to passive heatsinks, fan heatsinks and system fans are other solutions that exist for cooling integrated circuit devices. For example, ducted blowers, heat pipes and liquid cooling are all capable of dissipating additional heat. Due to their varying attributes, each of these solutions may be appropriate for a particular system implementation.
Processor Thermal/Mechanical Information § 26 Thermal and Mechanical Design Guidelines
Thermal Metrology 3 Thermal Metrology This chapter discusses guidelines for testing thermal solutions, including measuring processor temperatures. In all cases, the thermal engineer must measure power dissipation and temperature to validate a thermal solution. To define the performance of a thermal solution the “thermal characterization parameter”, (“psi”) will be used. 3.
Thermal Metrology CS is strongly dependent on the thermal conductivity and thickness of the TIM between the heatsink and IHS. SA is a measure of the thermal characterization parameter from the bottom of the heatsink to the local ambient air. SA is dependent on the heatsink material, thermal conductivity, and geometry. It is also strongly dependent on the air velocity through the fins of the heatsink. Figure 3-1 illustrates the combination of the different thermal characterization parameters. Figure 3-1.
Thermal Metrology Assume the TDP, as listed in the datasheet, is 100 W and the maximum case temperature from the thermal profile for 100 W is 67 °C. Assume as well that the system airflow has been designed such that the local ambient temperature is 38 °C. Then the following could be calculated using equation 1 (shown on previous page): CA = (TC,- TA) / TDP = (67 – 38) / 100 = 0.
Thermal Metrology For active heatsinks, it is important to avoid taking measurement in the dead flow zone that usually develops above the fan hub and hub spokes. Measurements should be taken at four different locations uniformly placed at the center of the annulus formed by the fan hub and the fan housing to evaluate the uniformity of the air temperature at the fan inlet. The thermocouples should be placed approximately 3 mm to 8 mm [0.1 to 0.
Thermal Metrology Figure 3-2. Locations for Measuring Local Ambient Temperature, Active ATX Heatsink Note: Drawing Not to Scale Figure 3-3.
Thermal Metrology 3.4 Processor Case Temperature Measurement Guidelines To ensure functionality and reliability, the processor is specified for proper operation when TC is maintained at or below the thermal profile as listed in the datasheet. The measurement location for TC is the geometric center of the IHS. Figure 2-2 shows the location for TC measurement. Special care is required when measuring TC to ensure an accurate temperature measurement. Thermocouples are often used to measure TC.
Thermal Management Logic and Thermal Monitor Feature 4 Thermal Management Logic and Thermal Monitor Feature 4.1 Processor Power Dissipation An increase in processor operating frequency not only increases system performance, but also increases the processor power dissipation. The relationship between frequency and power is generalized in the following equation: P = CV2F (where P = power, C = capacitance, V = voltage, F = frequency).
Thermal Management Logic and Thermal Monitor Feature 4.2.1 PROCHOT# Signal The primary function of the PROCHOT# signal is to provide an external indication the processor has reached the TCC activation temperature. While PROCHOT# is asserted, the TCC will be active. Assertion of the PROCHOT# signal is independent of any register settings within the processor. It is asserted any time the processor die temperature reaches the trip point.
Thermal Management Logic and Thermal Monitor Feature Figure 4-1. Thermal Monitor Control PROCHOT# Normal clock Internal clock Duty cycle control Resultant internal clock 4.2.3 Thermal Monitor 2 The second method of power reduction is TM2. TM2 provides an efficient means of reducing the power consumption within the processor and limiting the processor temperature. When TM2 is enabled, and a high temperature situation is detected, the enhanced TCC will be activated.
Thermal Management Logic and Thermal Monitor Feature Once the processor has sufficiently cooled, and a minimum activation time has expired, the operating frequency and voltage transition back to the normal system operating point. Transition of the VID code will occur first, in order to insure proper operation once the processor reaches its normal operating frequency. Refer to Figure 4-2 for an illustration of this ordering. Figure 4-2.
Thermal Management Logic and Thermal Monitor Feature Regardless of the configuration selected, PROCHOT# will always indicate the thermal status of the processor. The power reduction mechanism of thermal monitor can also be activated manually using an “on-demand” mode. Refer to Section 4.2.5 for details on this feature. 4.2.5 On-Demand Mode For testing purposes, the thermal control circuit may also be activated by setting bits in the ACPI MSRs. The MSRs may be set based on a particular system event (e.g.
Thermal Management Logic and Thermal Monitor Feature A system designed to meet the thermal profile specification published in the processor datasheet greatly reduces the probability of real applications causing the thermal control circuit to activate under normal operating conditions. Systems that do not meet these specifications could be subject to more frequent activation of the thermal control circuit depending upon ambient air temperature and application power profile.
Thermal Management Logic and Thermal Monitor Feature The processor introduces the Digital Thermal Sensor (DTS) as the on-die sensor to use for fan speed control (FSC). The DTS will eventually replace the on-die thermal diode used in pervious products. The processor will have both the DTS and thermal diode enabled. The DTS is monitoring the same sensor that activates the TCC (see Section 4.2.2). Readings from the DTS are relative to the activation of the TCC.
Thermal Management Logic and Thermal Monitor Feature QST), see Chapter 7 and the Intel® Quiet System Technology Configuration and Tuning Manual. Intel has worked with many vendors that provide fan speed control devices to provide PECI host controllers. Please consult the local representative for your preferred vendor for their product plans and availability.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5 Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5.1 Overview of the Balanced Technology Extended (BTX) Reference Design The reference thermal module assembly is a Type II BTX compliant design and is compliant with the reference BTX motherboard keep-out and height recommendations defined Section 6.6. The solution comes as an integrated assembly. An isometric view of the assembly is provided Figure 5-4. 5.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information Table 5-1. Balanced Technology Extended (BTX) Type II Reference TMA Performance Processor Thermal Requirements, ca (Mean + 3 ) TA Assumption Notes Intel® Core™2 Duo processor with 4 MB cache at Tc-max of 60.1 °C 0.38 C/W 35.5 C 1,2 Intel® Core™2 Duo processor with 4 MB / 2 MB cache at Tc-max of 72.0 °C 0.56 C/W 35.5 C 1,2,3 Intel® Core™2 Duo processor with 2 MB cache at Tc-max of 61.4 °C 0.40 C/W 35.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information Table 5-2. Acoustic Targets Fan Speed RPM Thermistor Set Point Acoustic Thermal Requirements, ca Notes ~ 5300 High TA 35 °C 6.4 BA 0.38 C/W Case 1: Thermal Design Power Maximum fan speed 100% PWM duty cycle ~ 2500 Low TA = 23 °C No Target Defined 0.56 C/W Case 2 Thermal Design Power System (PSU, HDD, TMA) Fan speed limited by the fan hub thermistor ~ 1400 Low TA = 23 °C 3.4 BA ~0.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5.1.3 Effective Fan Curve The TMA must fulfill the processor cooling requirements shown in Table 5-1 when it is installed in a functional BTX system. When installed in a system, the TMA must operate against the backpressure created by the chassis impedance (due to vents, bezel, peripherals, etc…) and will operate at lower net airflow than if it were tested outside of the system on a bench top or open air environment.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information Figure 5-1. Effective TMA Fan Curves with Reference Extrusion 0.400 Reference TMA @ 5300 RPM 0.350 Reference TMA @ 2500 RPM 0.300 Reference TMA @ 1200 RPM 0.250 0.200 0.150 0.100 0.050 0.000 0.0 5.0 10.0 15.0 20.0 25.0 30.0 35.0 Airflow (cfm) 5.1.4 Voltage Regulator Thermal Management The BTX TMA is integral to the cooling of the processor voltage regulator (VR).
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information Table 5-3. VR Airflow Requirements Item Minimum VR bypass airflow for 775_VR_CONFIG_06 processors Target 2.4 CFM NOTES: 1. This is the recommended airflow rate that should be delivered to the VR when the VR power is at a maximum in order to support the 775_VR_CONFIG_06 processors at TDP power dissipation and the chassis external environment temperature is at 35 ºC.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5.2.1.1 Random Vibration Test Procedure Recommended performance requirement for a system: Duration: 10 min/axis, 3 axes Frequency Range: 5 Hz to 500 Hz 5 Hz @ .001 g2/Hz to 20 Hz @ 0.01 g2/Hz (slope up) 20 Hz to 500 Hz @ 0.01 g2/Hz (flat) Power Spectral Density (PSD) Profile: 2.2 G RMS Figure 5-2. Random Vibration PSD Vibration System Level 0.1 + 3 dB Control Limit 0.01 - 3 dB Control Limit 0.001 0.0001 1 10 100 1000 Hz 5.2.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information Figure 5-3. Shock Acceleration Curve 5.2.1.2.1 Recommended Test Sequence Each test sequence should start with components (i.e., motherboard, heatsink assembly, etc.) that have never been previously submitted to any reliability testing. The test sequence should always start with a visual inspection after assembly, and BIOS/CPU/Memory test (refer to Section 6.3.3).
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5.2.2 Power Cycling Thermal performance degradation due to TIM degradation is evaluated using power cycling testing. The test is defined by 7500 cycles for the case temperature from room temperature (~23 ºC) to the maximum case temperature defined by the thermal profile at TDP. 5.2.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5.4 Safety Requirements Heatsink and attachment assemblies shall be consistent with the manufacture of units that meet the safety standards: UL Recognition-approved for flammability at the system level. All mechanical and thermal enabling components must be a minimum UL94V-2 approved. CSA Certification. All mechanical and thermal enabling components must have CSA certification.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 5.6 Preload and TMA Stiffness 5.6.1 Structural Design Strategy Structural design strategy for the Intel Type II TMA is to minimize upward board deflection during shock to help protect the LGA775 socket. BTX thermal solutions utilize the SRM and TMA that together resists local board curvature under the socket and minimize, board deflection (Figure 5-5). In addition, a moderate preload provides initial downward deflection.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information Table 5-4, then the Thermal Module should be re-designed to have a preload that lies within the range given in Table 5-4, allowing for preload tolerances. Table 5-4. Processor Preload Limits Parameter Processor Preload Minimum Required Maximum Allowed Notes 98 N [22 lbf] 222 N [50 lbf] 1 NOTES: 1. These values represent upper and lower bounds for the processor preload.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information mounting hole position for TMA attach, the required preload is approximately 10-15N greater than the values stipulated in Figure 5-6; however, Intel has not conducted any validation testing with this TMA mounting scheme. Figure 5-7.
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 54 Thermal and Mechanical Design Guidelines
ATX Thermal/Mechanical Design Information 6 ATX Thermal/Mechanical Design Information 6.1 ATX Reference Design Requirements This chapter will document the requirements for an active air-cooled design, with a fan installed at the top of the heatsink. The thermal technology required for the processor. The processors of Intel® Core™2 Duo processor with 4 MB cache at Tc-max of 60.1 °C, Intel® Core™2 Duo processor with 2 MB cache at Tc-max of 61.
ATX Thermal/Mechanical Design Information Figure 6-1. D60188-001Reference Design – Exploded View The processors of Intel® Core™2 Duo processor with 4 MB / 2 MB cache at Tc-max of 72.0 °C, Intel® Core™2 Duo processor with 2 MB cache at Tc-max of 73.3 °C, Intel® Pentium® Dual Core processor E2000 series at Tc-max of 73.3 °C, and Intel® Celeron® Dual-Core processor E1000 series at Tc-max of 73.
ATX Thermal/Mechanical Design Information Figure 6-2. E18764-001 Reference Design – Exploded View Figure 6-3. Bottom View of Copper Core Applied by TC-1996 Grease The ATX motherboard keep-out and the height recommendations defined Section 6.6 remain the same for a thermal solution for the processor in the 775-Land LGA package. Note: If this fan design is used in your product and you will deliver it to end use customers, you have the responsibility to determine an adequate level of protection (e.g.
ATX Thermal/Mechanical Design Information 6.2 Validation Results for Reference Design 6.2.1 Heatsink Performance Table 6-1 provides the D60188-001 heatsink performance for the processors of Intel® Core™2 Duo processor with 4 MB cache at Tc-max of 60.1 °C, Intel® Core™2 Duo processor with 2 MB cache at Tc-max of 61.4 °C, and Intel® Pentium® Dual Core processor E2000 series at Tc-max of 61.4 °C.
ATX Thermal/Mechanical Design Information 6.2.2 Acoustics To optimize acoustic emission by the fan heatsink assembly, the reference design implements a variable speed fan. A variable speed fan allows higher thermal performance at higher fan inlet temperatures (TA) and lower thermal performance with improved acoustics at lower fan inlet temperatures.
ATX Thermal/Mechanical Design Information TCONTROL specifications described in Section 2.2.3. Intel recommendation is to use the fan with 4 Wire PWM Controlled to implement fan speed control capability based digital thermal sensor temperature. Refer to Chapter 7 for further details. Note: Appendix G gives detailed fan performance for the Intel reference thermal solutions with 4 Wire PWM Controlled fan. 6.2.
ATX Thermal/Mechanical Design Information 6.3 Environmental Reliability Testing 6.3.1 Structural Reliability Testing Structural reliability tests consist of unpackaged, board-level vibration and shock tests of a given thermal solution in the assembled state. The thermal solution should meet the specified thermal performance targets after these tests are conducted; however, the test conditions outlined here may differ from your own system requirements. 6.3.1.
ATX Thermal/Mechanical Design Information Figure 6-5. Shock Acceleration Curve A c c e l e r a t i o n (g) 60 50 40 30 20 10 0 0 2 4 6 8 10 12 Time (m illiseconds) 6.3.1.2.1 Recommended Test Sequence Each test sequence should start with components (i.e., motherboard, heatsink assembly, etc.) that have never been previously submitted to any reliability testing. The test sequence should always start with a visual inspection after assembly, and BIOS/CPU/Memory test (refer to Section 6.3.3).
ATX Thermal/Mechanical Design Information 6.3.2 Power Cycling Thermal performance degradation due to TIM degradation is evaluated using power cycling testing. The test is defined by 7500 cycles for the case temperature from room temperature (~23 ºC) to the maximum case temperature defined by the thermal profile at TDP. 6.3.
ATX Thermal/Mechanical Design Information 6.5 Safety Requirements Heatsink and attachment assemblies shall be consistent with the manufacture of units that meet the safety standards: UL Recognition-approved for flammability at the system level. All mechanical and thermal enabling components must be a minimum UL94V-2 approved. CSA Certification. All mechanical and thermal enabling components must have CSA certification.
ATX Thermal/Mechanical Design Information 6.7 Reference Attach Mechanism 6.7.1 Structural Design Strategy Structural design strategy for the reference design is to minimize upward board deflection during shock to help protect the LGA775 socket. The reference design uses a high clip stiffness that resists local board curvature under the heatsink, and minimizes, in particular, upward board deflection (Figure 6-6). In addition, a moderate preload provides initial downward deflection. Figure 6-6.
ATX Thermal/Mechanical Design Information 6.7.2 Mechanical Interface to the Reference Attach Mechanism The attach mechanism component from the reference design can be used by other 3rd party cooling solutions. The attach mechanism consists of: A metal attach clip that interfaces with the heatsink core, see Appendix H, Figure 7-55 and Figure 7-56 for the component drawings. Four plastic fasteners, see Appendix H, Figure 7-57, Figure 7-58, Figure 7-59 and Figure 7-60 for the component drawings.
ATX Thermal/Mechanical Design Information Figure 6-8. Critical Parameters for Interfacing to Reference Clip Fan Fin Array Core See Detail A Clip Fin Array Clip 1.6 mm Core Detail A Figure 6-9. Critical Core Dimension 38.68 +/- 0.30 mm 36.14 +/- 0.10 mm Gap required to avoid core surface blemish during clip assembly. Recommend 0.3 mm min. 1.00 +/- 0.10 mm Core 1.00 mm min R 0.40 mm max R 0.40 mm max 2.596 +/- 0.
ATX Thermal/Mechanical Design Information 68 Thermal and Mechanical Design Guidelines
Intel® Quiet System Technology (Intel® QST) 7 Intel® Quiet System Technology (Intel® QST) In the Intel® 965 Express Family Chipset a new control algorithm for fan speed control is being introduced. It is composed of an Intel ® Management Engine (ME) in the Graphics Memory Controller Hub (GMCH) which executes the Intel ® Quiet System Technology (Intel® QST) algorithm and the ICH8 containing the sensor bus and fan control circuits.
Intel® Quiet System Technology (Intel® QST) Figure 7-1. Intel® QST Overview Intel® QST Temperature sensing and response Calculations Fan to sensor Relationship Fan Commands (PID) (Output Weighting Matrix) (PID) PECI / SST PWM Temperature Sensors Fans System Response 7.1.1 Output Weighting Matrix Intel QST provides an Output Weighting Matrix that provides a means for a single thermal sensor to affect the speed of multiple fans.
Intel® Quiet System Technology (Intel® QST) target temperature. As a result of its operation, the PID control algorithm can enable an acoustic-friendly platform. Figure 7-2. PID Controller Fundamentals Integral (time averaged) Actual Temperature Limit Temperature Proportional Error Derivative (Slope) Time Fan Speed For a PID algorithm to work limit temperatures are assigned for each temperature sensor. For Intel QST, the TCONTROL for the processor and chipset are to be used as the limit temperature.
Intel® Quiet System Technology (Intel® QST) 7.2 Board and System Implementation of Intel® QST To implement the board must be configured as shown in Figure 7-3 and listed below: ME system (S0-S1) with Controller Link connected and powered DRAM with Channel A DIMM 0 installed and 2MB reserved for Intel® QST FW execution SPI Flash with sufficient space for the Intel® QST Firmware SST-based thermal sensors to provide board thermal data for Intel® QST algorithms Intel® QST firmware Figure 7-3.
Intel® Quiet System Technology (Intel® QST) Figure 7-4 shows the major connections for a typical implementation that can support processors with Digital thermal sensor or a thermal diode. In this configuration a SST Thermal Sensor has been added to read the on-die thermal diode that is in all of the processors in the 775-land LGA packages shipped before the Intel® Core™2 Duo processor. With the proper configuration information the ME can be accommodate inputs from PECI or SST for the processor socket.
Intel® Quiet System Technology (Intel® QST) 7.3 Intel® QST Configuration and Tuning Initial configuration of the Intel QST is the responsibility of the board manufacturer. The SPI flash should be programmed with the hardware configuration of the motherboard and initial settings for fan control, fan monitoring, voltage and thermal monitoring. This initial data is generated using the Intel provided Configuration Tool.
LGA775 Socket Heatsink Loading Appendix A LGA775 Socket Heatsink Loading A.1 LGA775 Socket Heatsink Considerations Heatsink clip load is traditionally used for: Mechanical performance in mechanical shock and vibration Refer to Section 6.7.
LGA775 Socket Heatsink Loading Simulation shows that the solder joint force (Faxial) is proportional to the board deflection measured along the socket diagonal. The matching of F axial required to protect the LGA775 socket solder joint in temperature cycling is equivalent to matching a target MB deflection.
LGA775 Socket Heatsink Loading Figure 7-6. Board Deflection Definition d’1 d1 d2 d’2 A.2.3 Board Deflection Limits Deflection limits for the ATX/µATX form factor are: d_BOL - d_ref 0.09 mm and d_EOL - d_ref 0.15 mm And d’_BOL – d’_ref 0.09 mm and d_EOL’ – d_ref’ 0.15 mm NOTES: 1. The heatsink preload must remain within the static load limits defined in the processor datasheet at all times. 2. Board deflection should not exceed motherboard manufacturer specifications.
LGA775 Socket Heatsink Loading A.2.4 Board Deflection Metric Implementation Example This section is for illustration only, and relies on the following assumptions: 72 mm x 72 mm hole pattern of the reference design Board stiffness = 900 lb/in at BOL, with degradation that simulates board creep over time Though these values are representative, they may change with selected material and board manufacturing process. Check with your motherboard vendor. Clip stiffness assumed constant – No creep.
LGA775 Socket Heatsink Loading Figure 7-7. Example: Defining Heatsink Preload Meeting Board Deflection Limit A.2.5 Additional Considerations Intel recommends to design to {d_BOL - d_ref = 0.15mm} at BOL when EOL conditions are not known or difficult to assess. The following information is given for illustration only. It is based on the reference keep-out, assuming there is no fixture that changes board stiffness: d_ref is expected to be 0.18 mm on average, and be as high as 0.
LGA775 Socket Heatsink Loading A.2.5.1 Motherboard Stiffening Considerations To protect LGA775 socket solder joint, designers need to drive their mechanical design to: Allow downward board deflection to put the socket balls in a desirable force state to protect against fatigue failure of socket solder joint (refer to Sections A.2.1, A.2.2, and A.2.3.
Heatsink Clip Load Metrology Appendix B Heatsink Clip Load Metrology B.1 Overview This section describes a procedure for measuring the load applied by the heatsink/clip/fastener assembly on a processor package. This procedure is recommended to verify the preload is within the design target range for a design, and in different situations. For example: Heatsink preload for the LGA775 socket Quantify preload degradation under bake conditions. Note: This document reflects the current metrology used by Intel.
Heatsink Clip Load Metrology Remarks: Alternate Heatsink Sample Preparation As mentioned above, making sure that the load cells have minimum protrusion out of the heatsink base is paramount to meaningful results. An alternate method to make sure that the test setup will measure loads representative of the non-modified design is: Machine the pocket in the heat sink base to a depth such that the tips of the load cells are just flush with the heat sink base Then machine back the heatsink base by around 0.
Heatsink Clip Load Metrology Figure 7-9. Load Cell Installation in Machined Heatsink Base Pocket – Side View Wax to maintain load cell in position during heatsink installation Height of pocket ~ height of selected load cell Load cell protrusion (Note: to be optimized depending on assembly stiffness) Figure 7-10.
Heatsink Clip Load Metrology B.2.2 Typical Test Equipment For the heatsink clip load measurement, use equivalent test equipment to the one listed Table 7-2. Table 7-2. Typical Test Equipment Item Load cell Notes: 1, 5 Part Number (Model) Description Honeywell*-Sensotec* Model 13 subminiature load cells, compression only AL322BL Select a load range depending on load level being tested. www.sensotec.
Heatsink Clip Load Metrology B.3.1 Time-Zero, Room Temperature Preload Measurement 1. Pre-assemble mechanical components on the board as needed prior to mounting the motherboard on an appropriate support fixture that replicate the board attach to a target chassis For example: standard ATX board should sit on ATX compliant stand-offs.
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Thermal Interface Management Appendix C Thermal Interface Management To optimize a heatsink design, it is important to understand the impact of factors related to the interface between the processor and the heatsink base. Specifically, the bond line thickness, interface material area and interface material thermal conductivity should be managed to realize the most effective thermal solution. C.
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Case Temperature Reference Metrology Appendix D Case Temperature Reference Metrology D.1 Objective and Scope This appendix defines a reference procedure for attaching a thermocouple to the IHS of a 775-land LGA package for TC measurement. This procedure takes into account the specific features of the 775-land LGA package and of the LGA775 socket for which it is intended. The recommended equipment for the reference thermocouple installation, including tools and part numbers are also provided.
Case Temperature Reference Metrology Item Description Part Number Miscellaneous Hardware Solder Indium Corp. of America Alloy 57BI / 42SN / 1AG 0.010 Diameter 52124 Flux Indium Corp.
Case Temperature Reference Metrology D.3 Thermal Calibration and Controls It is recommended that full and routine calibration of temperature measurement equipment be performed before attempting to perform temperature case measurement. Intel recommends checking the meter probe set against known standards. This should be done at 0 ºC (using ice bath or other stable temperature source) and at an elevated temperature, around 80 ºC (using an appropriate temperature source).
Case Temperature Reference Metrology The orientation of the groove at 6 o’clock exit relative to the package pin 1 indicator (gold triangle in one corner of the package) is shown in Figure 7-14 for the 775-Land LGA package IHS. Figure 7-14. IHS Groove at 6 o’clock Exit on the 775-LAND LGA Package IHS Groove Pin1 indicator When the processor is installed in the LGA775 socket, the groove is parallel to the socket load lever, and is toward the IHS notch as shown Figure 7-15. Figure 7-15.
Case Temperature Reference Metrology D.5 Thermocouple Attach Procedure The procedure to attach a thermocouple with solder takes about 15 minutes to complete. Before proceeding turn on the solder block heater, as it can take up to 30 minutes to reach the target temperature of 153 – 155 °C. Note: To avoid damage to the processor ensure the IHS temperature does not exceed 155 °C. As a complement to the written procedure a video Thermocouple Attach Using Solder – Video CD-ROM is available. D.5.
Case Temperature Reference Metrology Figure 7-17. Bending the Tip of the Thermocouple D.5.2 Thermocouple Attachment to the IHS 12. Clean groove and IHS with Isopropyl Alcohol (IPA) and a lint free cloth removing all residues prior to thermocouple attachment. 13. Place the thermocouple wire inside the groove; letting the exposed wire and bead extend about 1.5 mm [0.030 inch] past the end of groove. Secure it with Kapton* tape (Figure 7-18). Clean the IHS with a swab and IPA. 14.
Case Temperature Reference Metrology Figure 7-19. Thermocouple Bead Placement (A) (B) 16. Place the package under the microscope to continue with process. It is also recommended to use a fixture (like processor tray or a plate) to help holding the unit in place for the rest of the attach process. 17. While still at the microscope, press the wire down about 6mm [0.125”] from the thermocouple bead using the tweezers or your finger.
Case Temperature Reference Metrology Figure 7-20. Position Bead on the Groove Step Wire section into the groove to prepare for final bead placement Kapton* tape Figure 7-21. Detailed Thermocouple Bead Placement TC Bead TC Wire with Insulation IHS with Groove Figure 7-22.
Case Temperature Reference Metrology 18. Place a 3rd piece of tape at the end of the step in the groove as shown in Figure 7-22. This tape will create a solder dam to prevent solder from flowing into the larger IHS groove section during the melting process. 19. Measure resistance from thermocouple end wires (hold both wires to a DMM probe) to the IHS surface. This should be the same value as measured during the thermocouple conditioning Section D.5.1.step 3 (Figure 7-23). Figure 7-23.
Case Temperature Reference Metrology Figure 7-24. Applying Flux to the Thermocouple Bead 21. Cut two small pieces of solder 1/16 inch (0.065 inch / 1.5 mm) from the roll using tweezers to hold the solder while cutting with a fine blade(see Figure 7-25) Figure 7-25. Cutting Solder 22.
Case Temperature Reference Metrology Figure 7-26. Positioning Solder on IHS 23. Measure the resistance from the thermocouple end wires again using the DMM (refer to Section D.5.1.step 2) to ensure the bead is still properly contacting the IHS. D.5.3 Solder Process 24. Make sure the thermocouple that monitors the Solder Block temperature is positioned on the Heater block. Connect the thermocouple to a handheld meter to monitor the heater block temperature. 25.
Case Temperature Reference Metrology Figure 7-27. Solder Station Setup 27. Remove the land side protective cover and place the device to be soldered in the solder station. Make sure the thermocouple wire for the device being soldered is exiting the heater toward you. Note: Do not touch the copper heater block at any time as this is very hot. 28. Move a magnified lens light close to the device in the solder status to get a better view when the solder begins to melt. 29. Lower the Heater block onto the IHS.
Case Temperature Reference Metrology Figure 7-28. View Through Lens at Solder Station Figure 7-29.
Case Temperature Reference Metrology 31. Lift the heater block and magnified lens, using tweezers quickly rotate the device 90 degrees clockwise. Using the back of the tweezers press down on the solder this will force out the excess solder Figure 7-30. Removing Excess Solder 32. Allow the device to cool down. Blowing compressed air on the device can accelerate the cooling time.
Case Temperature Reference Metrology D.5.4 Cleaning and Completion of Thermocouple Installation 33. Remove the device from the solder station and continue to monitor IHS Temperature with a handheld meter. Place the device under the microscope and remove the three pieces of Kapton* tape with Tweezers, keeping the longest for re-use. 34. Straighten the wire and work the wire in to the groove. Bend the thermocouple over the IHS. Replace the long piece of Kapton* tape at the edge of the IHS.
Case Temperature Reference Metrology 36. Clean the surface of the IHS with Alcohol and use compressed air to remove any remaining contaminants. 37. Fill the rest of the groove with Loctite* 498 Adhesive. Verify under the microscope that the thermocouple wire is below the surface along the entire length of the IHS groove (see Figure 7-33). Figure 7-33. Filling Groove with Adhesive 38.
Case Temperature Reference Metrology Figure 7-35. Removing Excess Adhesive from IHS 39. Using a blade, carefully shave any adhesive that is above the IHS surface (see Figure 7-35). The preferred method is to shave from the edge to the center of the IHS. Note: The adhesive shaving step should be performed while the adhesive is partially cured, but still soft. This will help to keep the adhesive surface flat and smooth with no pits or voids.
Case Temperature Reference Metrology 45. Place the device in a tray or bag until it is ready to be used for thermal testing use. D.6 Thermocouple Wire Management When installing the processor into the socket, the thermocouple wire should route under the socket lid, as shown in Figure 7-37. This will keep the wire from getting damaged or pinched when removing and installing the heatsink. Note: When thermocouple wires are damaged, the resulting reading maybe wrong.
Legacy Fan Speed Control Appendix E Legacy Fan Speed Control A motherboard design may opt to use a SIO or ASIC based fan speed control device that uses the existing look up or state based fan speed control.
Legacy Fan Speed Control The benefit of this upper limit will become more apparent when the fan speed controller is responding to the on-die thermal sensor. Figure 7-38. Thermistor Set Points Variable Speed Fan (VSF) Curve Full Speed Min. Operating 38 30 Fan Inlet Temperature (°C) E.1.2 Minimum Fan Speed Set Point The final aspect of thermal solution design is to determine the minimum speed the fan will be allowed to operate.
Legacy Fan Speed Control E.2 Board and System Implementation Once the thermal solution is defined, the system designer and board designer can define the fan speed control implementation. The first step is to select the appropriate fan speed controller (FSC). Figure 7-39 shows the major connections for a typical implementation. Figure 7-39.
Legacy Fan Speed Control These are the minimum parameters required to implement acoustic fan speed control. See Figure 7-40 for an example. There may be vendor specific options that offer enhanced functionality. See the appropriate vendor datasheet on how to implement those features. Figure 7-40. Fan Speed Control Full Speed 100 % Min Speed X% TLOW TCONTROL Diode Temperature (°C) E.2.1.1 Temperature to begin fan acceleration The first item to consider is the value for TLOW.
Legacy Fan Speed Control Figure 7-41. Temperature Range = 5 °C Fan RPM Tdiode Tcontrol Tlow 3500 80 3000 75 2500 70 65 2000 60 1500 55 1000 50 500 45 0 40 Time (s) An alternate would be to consider a slightly larger value such as TRANGE = 10 °C. In this case the design is trading off the acoustic margin for thermal margin. There is increased granularity in the fan speeds. Fan speed oscillation are significantly reduced Maximum fan speed is lower The rate of change of CA vs.
Legacy Fan Speed Control Figure 7-42. Temperature Range = 10 °C Fan RPM Tdiode Tcontrol Tlow 3500 80 3000 75 70 2500 65 2000 60 1500 55 1000 50 500 45 0 40 Time (s) It should be noted that having TSENSOR above TCONTROL is expected for workloads near TDP power levels and high system ambient. See Section E.4 for additional discussion on TCONTROL versus Thermal Profile For use with the ATX Boxed Processor enabled reference solution a TRANGE value of 10 °C is recommended.
Legacy Fan Speed Control E.3 Combining Thermistor and On-Die Thermal Sensor Control There is no closed loop control between the FSC and the thermistor, but they work in tandem to provide the maximum fan speed reduction. As discussed in Section E.1.1, the thermistor establishes the VSF curve. This curve will determine the maximum fan speed as a function of the ambient temperature and by design provides a CA sufficient to meet the thermal profile.
Legacy Fan Speed Control To use all of the features in the Intel reference heatsink design or the Boxed Processor, system integrators should verify the following functionality is present in the board design. Please refer to the Fan Specification for 4 wire PWM Controlled Fans and Chapter 6 for complete details on the Intel enabled thermal solution. The basics of Fan Speed Control were discussed in Chapter 7, as a review the FSC definitions are listed in Table 7-3. Table 7-3.
Legacy Fan Speed Control Figure 7-44. FSC Definition Example Requirements Classification Required – an essential part of the design necessary to meet specifications. Should be considered a pass or fail in selection of a board. Suggested – highly desired for consistency among designs. May be specified or expanded by the system integrator. The motherboard needs to have a fan speed control component that has the following characteristics: PWM output programmable to 21–28 kHz (required).
Legacy Fan Speed Control Table 7-4.
Legacy Fan Speed Control Table 7-5. Balanced Technology Extended (BTX) Fan Speed Control Settings Parameter Classification Processor Thermal Sensor System Ambient Sensor THIGH Required TCONTROL 54 °C 3,5,9 TLOW Required TCONTROL – 7 °C 47 °C 3,5,9 Minimum PWM Duty Cycle Required PWM 1 (TMA) – 20% PWM Frequency Required 21-28 kHz 1 Spin Up Time Suggested 250 – ~ 500 ms 2, 7 TAVERAGING Suggested 4.0 sec 4.
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Balanced Technology Extended (BTX) System Thermal Considerations Appendix F Balanced Technology Extended (BTX) System Thermal Considerations There are anticipated system operating conditions in which the processor power may be low but other system component powers may be high. If the only Fan Speed Control (FSC) circuit input for the Thermal Module Assembly (TMA) fan is from the processor sensor then the fan speed and system airflow is likely to be too low in this operating state.
Balanced Technology Extended (BTX) System Thermal Considerations Part Number: C83274-002 BizLink USA Technology, Inc. 44911 Industrial Drive Fremont, CA 94538 USA (510)252-0786 phone (510)252-1178 fax sales@bizlinktech.com Part Number: 68801-0170 Molex Incorporated 2222 Wellington Ct. Lisle, IL 60532 1-800-78MOLEX phone 1-630-969-1352 fax amerinfo@molex.com Figure 7-45.
Balanced Technology Extended (BTX) System Thermal Considerations Figure 7-46.
Balanced Technology Extended (BTX) System Thermal Considerations 124 Thermal and Mechanical Design Guidelines
Fan Performance for Reference Design Appendix G Fan Performance for Reference Design The fan power requirements for proper operation are given Table 7-6. Table 7-6. Fan Electrical Performance Requirements Requirement Value Maximum Average fan current draw 1.5 A Fan start-up current draw 2.2 A Fan start-up current draw maximum duration 1.
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Fan Performance for Reference Design Thermal and Mechanical Design Guidelines 127
Mechanical Drawings Appendix HMechanical Drawings The following table lists the mechanical drawings included in this appendix. These drawings refer to the reference thermal mechanical enabling components for the processor. Note: Intel reserves the right to make changes and modifications to the design as necessary.
39.01 36.00 33.00 32.51 27.51 47.50 45.26 44.00 40.00 36.78 36.49 27.00 23.47 ( 16.87 ) 5.90 0.00 2 7.30 23.47 36.78 40.00 32.51 36.00 39.01 27.81 27.51 45.26 47.
DWG. NO. SH. 1 REV.
Intel Enabled Reference Solution Information Appendix I Intel Enabled Reference Solution Information This appendix includes supplier information for Intel enabled vendors for D60188-001 reference design, E18764-001 reference design and BTX reference design. The reference component designs are available for adoption by suppliers and heatsink integrators pending completion of appropriate licensing contracts. For more information on licensing, contact the Intel representative mentioned in Table 7-7.
Intel Enabled Reference Solution Information Note: These vendors and devices are listed by Intel as a convenience to Intel's general customer base, but Intel does not make any representations or warranties whatsoever regarding quality, reliability, functionality, or compatibility of these devices. This list and/or these devices may be subject to change without notice. Table 7-9.
Intel Enabled Reference Solution Information Table 7-10. Balanced Technology Extended (BTX) Reference Thermal Solution Providers Supplier Part Description Part Number Contact Phone Notes Mitac International Corp Support and Retention Module _ Michael Tsai 886-3-328-9000 Ext.
