Intel Celeron D Processor 3xx Sequence

Datasheet 29
Electrical Specifications
NOTES:
1. V
OS
is measured overshoot voltage.
2. T
OS
is measured time duration above VID.
2.12.1 Die Voltage Validation
Overshoot events from application testing on real processors must meet the specifications in
Table 2-17 when measured across the VCC_SENSE and VSS_SENSE pins. Overshoot events that
are < 10 ns in duration may be ignored. These measurements of processor die level overshoot
should be taken with a 100 MHz bandwidth limited oscilloscope.
Figure 2-3. V
CC
Overshoot Example Waveform
Time
Example Overshoot Waveform
Voltage (V)
VID
VID + 0.050
T
OS
V
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID