Intel Pentium 4 Processor 478-Pin Socket (mPGA478) Design Guidelines

Intel® Pentium® 4 Processor 478-Pin Socket (mPGA478)
R
34
Use Environment Speculative Stress Condition 7 year life
expectation
10 year life
expectation
Fast, large gradient on/off to max operating temp.
(power cycle or internally heated including power save
features)
Power Cycle 7,500 cycles 11,000 cycles
Shipping & Handling Mechanical Shock
50g trapezoidal profile; 170”/sec
Velocity change; 11 msec duration
pulse
3 drops / axis, 6 axis
Shipping & Handling Random Vibration
3.13 gRMS, random, 5 Hz - 20 Hz
.01 g2/Hz sloping up to .02 g2/Hz
20 Hz - 500 Hz .02 g2/Hz
10 min / axis, 3 axis
5.1. Porosity Test
5.1.1. Porosity Test Method
Use EIA 364, Test Procedure 53A, Nitric acid test. Porosity test to be performed for 20 contacts, randomly
selected per socket, 5 sockets.
5.1.2. Porosity Test Criteria
Maximum of two pores per set of 20 contacts, as measured per EIA 364, Test Procedure 60.
5.2. Plating Thickness
Measure various plating thickness on contact surface per EIA 364, Test Procedure 48, Method C or Method
A. Test to be performed using 20 randomly selected contacts per socket, 5 sockets. No plating thickness
measured shall be less than the minimum plating thickness specified in Section 3.4.3 –
Contact Area Plating.
5.3. Solvent Resistance
Requirement: No damage to ink markings if applicable.
EIA 364, Test Procedure 11A.
5.4. Durability
Per EIA specification 364, test procedure 9, (referenced in EIA 540), the total durability requirement is 20
cycles. The durability testing is performed with 4 separate devices, each undergoing 5 sequential durability
cycles. Measure contact resistance when mated in the 1st and 20th cycles. The package should be removed
at the end of each de-actuation cycle and reinserted into the socket.