Datasheet

TEK.COM 3
2606B System SourceMeter
®
SMU Instrument
2606B Front Panel
2606B Rear Panel
Digital I/O LAN USB-Device
Analog I/O
USB-HostTSP-Link
2606B SMU instruments are easily racked and stacked in a rack system
with minimum rail depth of 27 inches (0.686 m).
Third-generation SMU Instrument Design
Ensures Faster Test Times
Based on the proven architecture of the Series 2600B
instruments, the 2606B’s SMU instrument design
enhances test speed in several ways. For example, the
2606B uses a patented series ranging topology that
provides faster and smoother range changes and outputs
that settle more quickly.
The 2606B SMU instrument design supports two
modes of operation for use with a variety of loads.
In normal mode, the SMU instrument provides high
bandwidth performance for maximum throughput. In high
capacitance (high-C) mode, the SMU instrument uses
a slower bandwidth to provide robust performance with
higher capacitive loads.
Typical Applications
I-V functional test and characterization of a wide
range of devices, including:
• Optoelectronic devices
– Vertical cavity surface emitting
lasers (VCSELs), laser diodes
(used on 3D sensing systems)
– High brightness (HBLEDs), light-
emitting diodes (LEDs)
– Displays
• Integrated devices small scale
integrated (SSI) and large scale
integrated (LSI)
– Analog ICs
– Radio frequency integrated
circuits (RFICs)
– Application specific integrated
circuits (ASICs)
– System on a chip (SOC) devices
• Discrete and passive components
– Two-leaded sensors, disk drive
heads, metal oxide varistors
(MOVs), diodes, zener diodes,
sensors, capacitors, thermistors
– Three-leaded small signal bipolar
junction transistors (BJTs), field-
effect transistors (FETs), and more
• Simple ICs optos, drivers, switches, sensors,
converters, regulators