Datasheet

Page 3
Find us at www.keysight.com
Easy Access to Signals
The compact design with a 2.5 mm probe
tip diameter provides better visibility to
the circuit under test than conventional
5 mm or 3.5 mm probe tips. This makes
it easier to probe today’s fine pitched
space ICs and components. In addition,
the replaceable probe tip is spring loaded,
keeping it from slipping off the device you
are probing. All N2870A Series probes
come installed with one spring-loaded
probe tip and four spare probe tips (2
spring-loaded tips, and 2 rigid tips).
Figure 2. Sharp probe tip makes it easy to probe today’s fine pitched components.
To minimize the inductive effects that
cause ringing of high speed signals, use
the innovative ground blade or spring
ground connection. Adhesive copper pads
provided with the probe can be attached
on top of an IC and connected to its
ground pins to create a convenient ground
plane for the probe to connect to. When
used with the ground blade this method
provides an ideal ground connection
for probing signals with high frequency
contents.
The IC caps fits over the probe tip,
providing a convenient self-aligning
connection to fine-pitch IC pins. Every
N2870A Series probe comes with 5
different IC caps for IC lead pitches from
0.5 mm through 1.27 mm.
Figure 3. Short ground blade with copper ground plane pad provides an ideal ground connection
for probing signals with high frequency contents. The green 0.5 mm pitch IC cap fits over the probe
tip providing a convenient self-aligning connection to IC pins.