Datasheet

02 | Keysight | N3300 Series DC Electronic Loads - Data Sheet
Increase your manufacturing test
throughput with fast electronic loads
– Increase test system throughput
– Lower cost of ownership
– Decrease system development time
– Increase system reliability
– Increase system flexibility
– Stable operation down to zero volts
– DC connection terminal for ATE applications
Increase Test Throughput
Today’s high volume manufacturing requires optimization of test
system throughput, to maximize production volume without
increasing floorspace. The N3300 Series electronic loads can help
you in a number of ways to achieve this goal.
Reduced command processing time:
Commands are processed more than 10 times faster than
previous electronic loads.
Automatically execute stored command
sequences:
“Lists” of downloaded command sequences can execute
independent of the computer, greatly reducing the electronic load
command processing time and computer interaction time during
product testing.
Programmable delay allows for either
simultaneous or sequential load changes:
This is the most multiple output DC power supplies, simulating
real-life loading patterns, with a minimum of programming
commands.
Buffer measurement data:
Voltage, current, and power measurements can be buffered for
later readback to the computer, reducing computer interaction.
Control measurement speed vs. accuracy:
Decrease the number of measurement samples to achieve
greater measurement speed, or increase the number of samples
to achieve higher measurement accuracy. You can optimize your
measurements for each test.
Control rising and falling slew rates separately:
Reduce rate of loading change when necessary for DUT
stability or to simulate real life conditions, but otherwise change
load values at maximum rate.
Increase System Flexibility…for Both
Present and Future Requirements
Most power supply and battery charger test systems designed
today need to test a variety of products and/or assemblies. In the
future, additional products or assemblies may be needed. A
flexible family of electronic loads makes present system design
and future growth much easier.
Test low voltage power supplies:
The N3300 Series electronic loads operate with full stability down
to zero volts. Many other electronic loads available today have
been found to become unstable in the operating region below
one volt. When designing power supply test platforms, the trend
towards lower voltage requirements should be taken into
account. Refer to the specification and supplemental
characteristic tables for details of lower voltage operating
characteristics.
Choose DC load connection method:
Automatic test systems need consistency and reliability. Option
UJ1 8 mm screw connectors provide a simple screw onto which
your wires, terminated with insulated ring terminals, may be
securely mounted. This optional connector is specifically
designed for test systems. Wires may exit the plastic cover in
any direction, and multiple wires may be placed on each screw
terminal for easy parallel load connections. Up to AWG 4 wire
may be used.
Applications which require repeated connections/disconnections
are better suited to the standard connector. The standard
connector accepts an unterminated wire, and may be
hand-tightened. This connector is specifically designed for bench
applications and short-term automated tests.
Standard DC connectors
Option UJ1 8 mm screw
connectors