Datasheet

12 | Keysight | U2722A/U2723A USB Modular Source Measure Unit – Data Sheet
U2722P/U2723P Parametric Measurement Solution
Measure and analyze quickly and
efciently with all your essential
parametric measurement tools
at your ngertips
Parametric testing is used across a variety
of application and industries – from a
teaching tool in the education sector to
manufacturing and troubleshooting in the
semiconductor industry. Now, you can
measure and analyze quickly and efciently
in all these areas with the one-stop
Parametric Measurement Solution.
The Parametric Measurement Solution
bundle consists of the Keysight U2722A/
U2723A USB modular source measure-
ment unit and the Keysight Parametric
Measurement Manager Pro software, pro-
viding you a basic yet complete parametric
measurement test solution that analyzes
the performance of components such as
diodes and transistors without the need
for prior programming experience. The
optional Keysight U2941A parametric test
xture can further increase your parametric
test efciency and usability.
The U2722P/U2723P Parametric
Measurement Solution bundle is only
available in Europe and Asia, excluding
Japan.
Figure 5. Easily congure an I-V characterization test with the
Parametric Measurement Manager Pro software.
Figure 6. Execute the I-V characterization test to view results instantly.
Figure 7. The test results can also be viewed in tabular format for quick
analysis.