User's Manual Part 2

STAREX-IS BSM Manual
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Issue:1.
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SMD-011-PMA210
4.5.2. Test-related to Channel Element
Channel Element Test is performed in BIT(Built In Test) for each chip. The types of
BIT Test are as follows:
- Bus Interrupt Test
- ChipX16 Test
- PP2S Test
- PCG Test
This BIT Test is normally performed on Chip with OVHD channel and Chip seized with
a call and the result is reported to BSM.
Table 4.5-1CE Test Result Message
On-Demand DESCRIPTION
BIT_OK
BIT_BUS_FAIL
BIT_INT_FAIL
BIT_CHIPX16_FAIL BIT_PP2S_FAIL
BIT_PCG_FAIL
BIT_RAM_FAIL
BIT_PROGRESS_FAIL
NORMAL
BUS INTERFACE TEST FAIL
INTERNAL INTERRUPT TEST FAIL
CHIPX16 TEST FAIL
PCG TEST FAIL
MEMORY TEST FAIL
TEST PERFORMING FAIL
4.5.2.1. Channel Element Test Function
Function to perform BIT test by CHC and CHIP unit.
• Command TEST-CE :BSC=a ,BTS=b ,PROC=c [,CHC=d] [,CHIP=e];
a: BSC number (0~11)
b: BTS number (0~47)
c: RCP number (0~9)
d: Channel Card Number (0~9)
e: Chip Number (0~1)
• Input/Output