Datasheet

3
LT1780/LT1781
E
LECTR
IC
AL C CHARA TERIST
ICS
(Note 2)
PARAMETER CONDITIONS MIN TYP MAX UNITS
Logic Input Current 0.8V V
IN
2.0V 520 µA
Output Short-Circuit Current V
OUT
= 0V ±717 mA
Output Leakage Current SHUTDOWN V
OUT
= ±30V (Note 4) 10 100 µA
Data Rate R
L
= 3k, C
L
= 2500pF 120 kBaud
R
L
= 3k, C
L
= 1000pF 250 kBaud
Slew Rate R
L
= 3k, C
L
= 51pF 15 30 V/µs
R
L
= 3k, C
L
= 2500pF 4 7 V/µs
Propagation Delay Output Transition t
HL
High-to-Low (Note 5) 0.6 1.3 µs
Output Transition t
LH
Low-to-High 0.5 1.3 µs
Receiver
Input Voltage Thresholds Input Low Threshold (V
OUT
= High) 0.8 1.3 V
Input High Threshold (V
OUT
= Low) 1.7 2.4 V
Hysteresis 0.1 0.4 1 V
Input Resistance V
IN
= ±10V 357 k
Output Leakage Current SHUTDOWN (Note 4) 0 V
OUT
V
CC
110 µA
Output Voltage Output Low, I
OUT
= –1.6mA 0.2 0.4 V
Output High, I
OUT
= 160µA (V
CC
= 5V) 3.5 4.2 V
Output Short-Circuit Current Sinking Current, V
OUT
= V
CC
–10 mA
Sourcing Current, V
OUT
= 0V 10 20 mA
Propagation Delay Output Transition t
HL
High-to-Low (Note 6) 250 600 ns
Output Transition t
LH
Low-to-High 350 600 ns
Note 4: Supply current measurements in SHUTDOWN are performed with
V
ON/OFF
0.1V.
Note 5: For driver delay measurements, R
L
= 3k and C
L
= 51pF. Trigger
points are set between the driver’s input logic threshold and the output
transition to the zero crossing (t
HL
= 1.4V to 0V and t
LH
= 1.4V to 0V).
Note 6: For receiver delay measurements, C
L
= 51pF. Trigger points are
set between the receiver’s input logic threshold and the output transition
to standard TTL/CMOS logic threshold (t
HL
= 1.3V to 2.4V and t
LH
= 1.7V
to 0.8V).
The denotes specifications which apply over the operating temperature
range.
Note 1: Absolute Maximum Ratings are those values beyond which the life
of the device may be impaired.
Note 2: Testing done at V
CC
= 5V and V
ON/OFF
= 3V, unless otherwise
specified.
Note 3: Supply current is measured as the average over several charge
pump cycles. C
+
= C
= C1 = C2 = 0.1µF. All outputs are open, with all
driver inputs tied high.
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