Technical information

33
8. DESCRIPTION OF LABORATORY EQUIPMENT
Molecular Force Probe (MFP) Asylum
Research, Inc. :
• Brief description of MFP and MFP specifications from
Asylum Research, Inc.
• MFP Saftety Precautions
• Power Spectral Density of Deflection Thermal Noise of
0.01 N/m Cantilever taken with MFP in Air and Water
• Thermomicroscopes Microlever Specifications and
Corresponding Force Noise Levels with MFP
(*courtesy of J. Cleveland, Asylum Research, Inc.)
• Instructions for Statistical Analysis of High Resolution
Force Spectroscopy Adhesion Data
Atomic Force Microscope (AFM):
•
Digital Instruments
NanoScope® IIIA System Controller
with
Multimode
TM
AFM
• DI Multimode Saftety Precautions
• Procedures for Imaging of Standards at Atomic-Scale
Resolution Using the Digital Instruments Multimode AFM
• Instructions for Converting of Raw Multimode High
Resolution Force Spectroscopy Adhesion Data
(*courtesy
of M. Rixman)
Halcyonics MOD-1 Active Vibration
Isolation System