Technical information

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Withdraw and then re-engage again. Thermal drift or other
reasons may cause the z-center to change gradually with time.
It change suddenly when if tip leaves the surface resulting in a
fully retracted piezo (-220V).
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• Avoid using maximum scan sizes for long periods of
time. Some crystals have sensitivities which will allow them
to scan much larger than their nominal size specification.
Running a crystal near maximum scan size over many days
will result in a gradual lowering of sensitivity, which will
change the calibration. The slight decrease will tend to level
out as the crystal ages.
V. USE OF STIFF CANTILEVERS / TAPPING
MODE
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• Use Force Mode with extreme precaution.
With stiff cantilevers (e.g. Si tapping mode air tips), force
mode can potentially damage both the tip and sample.
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••
• Choose the setpoint as low as possible.
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••
• Before enabling the interleave drive amplitude, check
that this value is not much greater than the main drive
amplitude to prevent tip damage.
VI. SOFTWARE / HARDWARE
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• Never leave the controller ON while the computer is
turned off. The DSP (Digital Signal Processor) and Interface
boards inside the computer are extensions of the Nanoscope
Controller. They must be energized to maintain the
Nanoscope controller at proper outputs. Without the