Datasheet

MAX19707
10-Bit, 45Msps, Ultra-Low-Power
Analog Front-End
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ELECTRICAL CHARACTERISTICS (continued)
(V
DD
= 3V, OV
DD
= 1.8V, internal reference (1.024V), C
L
≈ 10pF on all digital outputs, f
CLK
= 45MHz (50% duty cycle), Rx ADC input
amplitude = -0.5dBFS, Tx DAC output amplitude = 0dBFS, differential Rx ADC input, differential Tx DAC output, C
REFP
= C
REFN
=
C
COM
= 0.33µF, unless otherwise noted. C
L
< 5pF on all aux-DAC outputs. Typical values are at T
A
= +25°C.) (Note 1)
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
DIGITAL INPUTS (CLK, SCLK, DIN, CS, D0–D9, T/R, SHDN)
Input High Threshold V
INH
0.7 x OV
DD
V
Input Low Threshold V
INL
0.3 x OV
DD
V
Input Leakage DI
IN
D0–D9, CLK, SCLK, DIN, CS, T/R,
SHDN = OGND or OV
DD
-1 +1 µA
Input Capacitance DC
IN
5pF
DIGITAL OUTPUTS (D0–D9, DOUT)
Output-Voltage Low V
OL
I
SINK
= 200µA
0.2 x OV
DD
V
Output-Voltage High V
OH
I
SOURCE
= 200µA 0.8 x OV
DD
V
Tri-State Leakage Current I
LEAK
-1 +1 µA
Tri-State Output Capacitance C
OUT
5pF
Note 1: Specifications from T
A
= +25°C to +85°C are guaranteed by production tests. Specifications from T
A
= +25°C to -40°C are
guaranteed by design and characterization.
Note 2: The minimum clock frequency (f
CLK
) for the MAX19707 is 7.5MHz (typical). The minimum aux-ADC sample rate clock fre-
quency (ACLK) is determined by f
CLK
and the chosen aux-ADC clock-divider value. The minimum aux-ADC ACLK >
7.5MHz / 128 = 58.6kHz. The aux-ADC conversion time does not include the time to clock the serial data out of the SPI™.
The maximum conversion time (for no averaging, NAVG = 1) will be, t
CONV
(max) = (12 x 1 x 128) / 7.5MHz = 205µs.
Note 3: SNR, SINAD, SFDR, HD3, and THD are based on a differential analog input voltage of -0.5dBFS referenced to the amplitude
of the digital outputs. SINAD and THD are calculated using HD2 through HD6.
Note 4: Crosstalk rejection is measured by applying a high-frequency test tone to one channel and a low-frequency tone to the second
channel. FFTs are performed on each channel. The parameter is specified as the power ratio of the first and second channel
FFT test tone.
Note 5: Amplitude and phase matching is measured by applying the same signal to each channel, and comparing the two output
signals using a sine-wave fit.
Note 6: Guaranteed by design and characterization.
SPI is a trademark of Motorola, Inc.