Datasheet

MAX3202E/MAX3203E/MAX3204E/MAX3206E
Low-Capacitance, 2/3/4/6-Channel, ±15kV ESD
Protection Arrays for High-Speed Data Interfaces
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Table 1. Reliability Test Data
TEST CONDITIONS DURATION FAILURES PER SAMPLE SIZE
Temperature Cycle
-35°C to +85°C,
-40°C to +100°C
150 cycles,
900 cycles
0/10,
0/200
Operating Life T
A
= +70°C 240hr 0/10
Moisture Resistance -20°C to +60°C, 90% RH 240hr 0/10
Low-Temperature Storage -20°C 240hr 0/10
Low-Temperature Operational -10°C 24hr 0/10
Solderability 8hr steam age — 0/15
ESD
±2000V, Human Body Model
— 0/5
High-Temperature Operating Life T
J
= +150°C 168hr 0/45
MAX3202E
V
CC
GND
I/O1 I/O2
MAX3203E
V
CC
GND
I/O1 I/O3
I/O2
MAX3204E
V
CC
GND
I/O1
I/O2
I/O3
I/O4
MAX3206E
V
CC
GND
I/O1
I/O2
I/O5
I/O6
I/O3
I/O4
Functional Diagrams
Chip Information
PROCESS: BiCMOS