Operation Manual
MI 3309 DeltaPAT Automatic test sequences
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6 Automatic test sequences
Simple test and Shortcut autotest are the fastest (autotest) modes for testing appliances.
In both test modes pre-programmed measurements run automatically in a sequential
order. The complete autotest results can be stored together with the associated appliance
ID and appliance NAME.
6.1 Simple test
Up to 50 customized sequences can be pre-programmed in this test mode. Typical simple
test sequences are added to the list by default.
The simple test sequences can be also uploaded from the PC software PATLink PRO.
Refer to chapter 8 Communication for more information. The pre-programmed sequences
can be restored to default settings by selecting Initial settings in Setup menu.
The list of pre-programmed simple test sequences can be found in Appendix B of this
manual.
Select Simple test in PAT testing Main menu.
Figure 6.1: Simple test menu
Keys:
Selects the test sequence from the list.
/
Starts the selected test. See chapter 6.3 Carrying out (Simple, Shortcut)
test sequences.
START
Returns to Main menu.
ESC
Note:
If more than 50 autotests are saved, »Out of custom autotest memory« message is
displayed.
6.2 Shortcut test sequences
In the Shortcut menu any of the pre-defined autotest procedures can be selected. Pre-
programmed sequences cover almost all in-service tests, regardless of appliance type and
safety class.
All limits and tests are in compliance with currently valid standards and regulations. In
case of any changes, new firmware will be available at your distributor or from Metrel
directly.
The number of autotest shortcut sequences that are offered by the instrument can be set
in the SHORTCUT SETUP menu. The complete list of autotest shortcut sequences can be
found in Appendix C of this manual.
Note:
The DeltaPAT instrument does not include all test functions and parameters
covered in the Shortcut codes. If such a Shortcut code is set the instrument
automatically perform alternative tests :
- a 200 mA Earth continuity test if a test current of more than 200 mA is set.