Operation Manual

MI 3310 / MI 3310A SigmaGT Appendix A – Preprogrammed autotests
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Appendix A – Preprogrammed autotests
Pre-programmed autotest sequences
No. Name Description
1
Cl_1_Iso
Testing according to VDE 0701-0702.
Class I device.
Insulation resistance and substitute leakage current measurements are
selected.
2
Cl1_Iso_BLT
Testing according to VDE 0701-0702.
Class I device with isolated accessible conductive parts.
Insulation resistance and substitute leakage current measurements are
selected.
3
Cl_1_Ia
Testing according to VDE 0701-0702.
Class I device.
Differential leakage current measurement is selected.
4
Cl_1_Ia_BLT
Testing according to VDE 0701-0702.
Class I device with isolated accessible conductive parts.
Differential leakage current and touch leakage current measurements
are selected.
5
Cl_2_Iso
Testing according to VDE 0701-0702.
Class II device with isolated accessible conductive parts.
Insulation resistance and substitute leakage current measurements are
selected.
6
Cl_2_Ibs
Testing according to VDE 0701-0702.
Class II device.
Touch leakage current measurement is selected.
7
Cl_1_IsoIa
Testing according to VDE 0701-0702.
Class I device.
Insulation resistance and differential leakage current measurements
are selected.
8
Cl1_IsoIaBLT
Testing according to VDE 0701-0702.
Class I device with isolated accessible conductive parts.
Insulation resistance, differential leakage current and touch leakage
current measurements are selected.
9
Cl_2_IsoIbs
Testing according to VDE 0701-0702.
Class II device with isolated accessible conductive parts.
Insulation resistance and touch leakage current measurements are
selected.
10
Cl_2
Testing according to VDE 0701-0702.
Class II device without any isolated accessible conductive parts.
11
Cl_3_Iso
Testing according to VDE 0701-0702.
Class II device with isolated accessible conductive parts.
12
Cl_3
Testing according to VDE 0701-0702.
Class II device without any isolated accessible conductive parts.