Operation Manual

MI 3310 / MI 3310A SigmaGT Technical specifications
23
Temperature coefficient outside reference temperature limits is 1 % of measured value
per C.
3.9 PRCD and RCD testing
3.9.1 Portable RCD trip-out time/current
AC and A type PRCD trip-out time:
Range Resolution Accuracy
0 ms 300 ms(½I
N
)
1 ms
3 ms 0 ms 300 ms (I
N
)
1 ms
0 ms 40 ms (5I
N
)
1 ms
B type PRCD trip out-current (supported by hardware release 2.0 and up):
Range I
Resolution Accuracy
0.2I
N
2.2I
N
(B type) 0.05I
N
0.1I
N
Powered by: ..................... mains
Test current type: ............. AC (sine-wave), A (pulsed), B (smooth DC)
Test currents (I
N
): ........... 10 mA, 15 mA, 30 mA
Test current multipliers: ... ½I
N
, I
N
, 5I
N
Start angle: ...................... 0 (+), 180 (-), both (+,-)
Test modes: ..................... single, autotest
Test terminals: ................. Mains test socket – IEC/PRCD test socket
PASS / FAIL limits: .......... ½I
N
: t
> 300 ms
I
N
: t
< 300 ms
5I
N
: t
< 40 ms
3.9.2 General RCD Trip-out time/current
Complete measurement range corresponds to EN 61557-6 requirements.
Maximum measuring times set according to selected reference for RCD testing.
AC and A type RCD trip-out time:
Range Resolution Accuracy
0 ms 300 ms (½I
N
)
0.1 ms
3 ms
0 ms 300 ms (I
N
)
0.1 ms
0 ms 40 ms (5I
N
)
0.1 ms
1 ms
B type RCD trip out-current (supported by hardware release 2.0 and up):
Range I
Resolution Accuracy
0.2I
N
2.2I
N
(B type) 0.05I
N
0.1I
N