Datasheet

Development Systems Ordering Guide
DS30177T-page 28 © 2005 Microchip Technology Inc.
Total Endurance™ Software Model
Microchip’s revolutionary Total Endurance Software
Model provides electronic system designers with
unprecedented visibility into serial EEPROM-based
applications. This advanced software model (with a
very friendly user interface) eliminates time and
guesswork from serial EEPROM-based designs by
accurately predicting the device’s performance and
reliability within a user-defined application
environment. Design trade-off analysis, which formerly
consumed days or weeks, can now be performed in
minutes – with a level of accuracy that delivers a truly
robust design.
With Microchip’s Total Endurance Software Model,
users may input the following application parameters:
Serial EEPROM device type
Bytes to be written per cycle
Cycling mode – byte or page
Data pattern type – random or worst-case
Temperature in °C
Erase/Write cycles per day
Application lifetime or target PPM level
The model will respond with FIT rate, PPM level,
application life and plot of the PPM level versus
number of cycles. The model is available in both
MS-DOS
®
and Windows
®
versions.
Features
Automatic or manual recalculation
Real-time update of data
Full screen or windowed graphical view
Hypertext on-screen help
Key or slide bar entry of parameters
On-screen editing of parameters
Single click copy of plot to clipboard
Numeric export to delimited text file
On-disk Total Endurance tutorial
Ordering Information:
Free download: www.microchip.com
F
R
E
E