Datasheet

MCP6V01/2/3
DS22058C-page 42 © 2008 Microchip Technology Inc.
APPENDIX B: OFFSET RELATED
TEST SCREENS
Input offset voltage related specifications in the DC
spec table (Table 1-1) are based on bench measure-
ments (see Section 2.1 “DC Input Precision”). These
measurements are much more accurate because:
• More compact circuit
• Soldered parts on the PCB
• More time spent averaging (reduces noise)
• Better temperature control
- Reduced temperature gradients
- Greater accuracy
We use production screens to ensure the quality of our
outgoing products. These screens are set at wider lim-
its to eliminate any fliers; see Tabl e B -1 .
TABLE B-1: OFFSET RELATED TEST SCREENS
Electrical Characteristics: Unless otherwise indicated, T
A
= 25°C, V
DD
= +1.8V to +5.5V, V
SS
= GND, V
CM
= V
DD
/3,
V
OUT
=V
DD
/2, V
L
=V
DD
/2, R
L
= 20 kΩ to V
L
, and CS = GND (refer to Figure 1-5 and Figure 1-6).
Parameters Sym Min Max Units Conditions
Input Offset
Input Offset Voltage V
OS
-10 +10 µV T
A
= +25°C (Note 1, Note 2)
Input Offset Voltage Drift with Temperature
(linear Temp. Co.)
TC
1
——nV/°CT
A
= -40 to +125°C (Note 3)
Power Supply Rejection PSRR 115 — dB (Note 1)
Common Mode
Common Mode Rejection CMRR 106 — dB V
DD
= 1.8V, V
CM
= -0.2V to 2.0V (Note 1)
CMRR 116 — dB V
DD
= 5.5V, V
CM
= -0.2V to 5.7V (Note 1)
Open-Loop Gain
DC Open-Loop Gain (large signal) A
OL
114 — dB V
DD
= 1.8V, V
OUT
= 0.2V to 1.6V (Note 1)
A
OL
122 — dB V
DD
= 5.5V, V
OUT
= 0.2V to 5.3V (Note 1)
Note 1: Due to thermal junctions and other errors in the production environment, these specifications are only screened in
production.
2: V
OS
is also sample screened at +125°C.
3: TC
1
is not measured in production.