Product data

MFRC631 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2014. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.3 — 4 February 2014
227433 27 of 120
NXP Semiconductors
MFRC631
High performance ISO/IEC 14443 A/B reader solution
used, the TDO pin is placed in an inactive drive state when not actively shifting out data.
Because TDO can be connected to the TDI of another controller in a daisy-chain
configuration, the IEEE Standard 1149.1 expects the value on TDO to change on the
falling edge of TCK.
8.4.6.6 Data register
According to the IEEE1149.1 standard there are two types of data register defined:
bypass and boundary scan
The bypass register enable the possibility to bypass a device when part of the scan
path.Serial data is allowed to be transferred through a device from the TDI pin to the TDO
pin without affecting the operation of the device.
The boundary scan register is the scan-chain of the boundary cells. The size of this
register is dependent on the command.
8.4.6.7 Boundary scan cell
The boundary scan cell opens the possibility to control a hardware pin independent of its
normal use case. Basically the cell can only do one of the following: control, output and
input.
8.4.6.8 Boundary scan path
This chapter shows the boundary scan path of the MFRC631.
Fig 21. Boundary scan cell path structure
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TAP
LOGIC LOGIC
TAP
IC1 IC2
TCK TMS
TCK TMS
TDO
TDO
Boundary scan cell
TDI
TDI
Table 19. Boundary scan path of the MFRC631
Number (decimal) Cell Port Function
23 BC_1 - Control
22 BC_8 CLKOUT Bidir
21 BC_1 - Control
20 BC_8 SCL2 Bidir
19 BC_1 - Control
18 BC_8 SDA2 Bidir
17 BC_1 - Control
16 BC_8 IFSEL0 Bidir
15 BC_1 - Control
14 BC_8 IFSEL1 Bidir