Information

Electrical characteristics STM32F20xxx
128/178 DocID15818 Rev 11
Figure 55. 12-bit buffered /non-buffered DAC
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
6.3.22 Temperature sensor characteristics
6.3.23 V
BAT
monitoring characteristics
R
LOAD
C
LOAD
Buffered/Non-buffered DAC
DAC_OUTx
Buffer(1)
12-bit
digital to
analog
converter
ai17157V2
Table 69. TS characteristics
Symbol Parameter Min Typ Max Unit
T
L
(1)
1. Based on characterization, not tested in production.
V
SENSE
linearity with temperature - ±1 ±2°C
Avg_Slope
(1)
Average slope - 2.5 mV/°C
V
25
(1)
Voltage at 25 °C - 0.76 V
t
START
(2)
2. Guaranteed by design, not tested in production.
Startup time - 6 10 µs
T
S_temp
(3)(2)
3. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the
temperature
1°C accuracy
10 - - µs
Table 70. V
BAT
monitoring characteristics
Symbol Parameter Min Typ Max Unit
R Resistor bridge for V
BAT
-50-KΩ
Q
Ratio on V
BAT
measurement - 2 -
Er
(1)
1. Guaranteed by design, not tested in production.
Error on Q –1 - +1 %
T
S_vbat
(2)(2)
2. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the V
BAT
1mV accuracy
5--µs