user manual

Debugger General Information
B-48
B
Flash Test Configuration Acceptable Entries
Command Input:
177-Diag>cf flash
FLASH Configuration Data:
Flash Device Test Mask =00000001 ?
0 or 1
Flash Test Starting Block =00000000 ? 0 through F
Flash Test Ending Block =0000000F ? 0 through F
Save/Restore For PATS Test [Y?N] =Y ? Y or N
Fill Data =000000FF ? any byte 00 through FF
Test Data Increment/Decrement Step =00000001? 0, 1, 2, F (-1) etc.
177-Bug>sd
177-Diag>he flash
FLASH Flash Memory Tests (DIR)
TESTS
ERASE Erase
FILL Fill
PATS Patterns
Erase Test
The erase test erases Flash memory according to the current test
configuration parameters selecting starting and ending blocks.
Command Input:
177-Diag>flash erase
Flash Fill Test
This test executes on the i28f008sa FLASHFILE
TM
memory devices,
each having sixteen 64Kb blocks. On the MVME177 Flash memory
is jumper selectable (mapping to begin at $FF800000 or $FFA00000).