DAQ 6023E/6024E/6025E Multifunction I/O Devices User Manual
Table Of Contents
- 6023E/6024E/6025E User Manual
- Support
- Important Information
- Contents
- About This Manual
- Chapter 1 Introduction
- Chapter 2 Installation and Configuration
- Chapter 3 Hardware Overview
- Chapter 4 Signal Connections
- I/O Connector
- Analog Input Signal Overview
- Analog Input Signal Connections
- Analog Output Signal Connections
- Digital I/O Signal Connections
- Programmable Peripheral Interface (PPI)
- Power Connections
- Timing Connections
- Field Wiring Considerations
- Chapter 5 Calibration
- Appendix A Specifications
- Appendix B Custom Cabling and Optional Connectors
- Appendix C Common Questions
- Appendix D Technical Support Resources
- Glossary
- Index
- Figures
- Figure 1-1. The Relationship Between the Programming Environment, NI-DAQ, and Your Hardware
- Figure 3-1. PCI-6023E, PCI-6024E, PCI-6025E, and PXI-6025E Block Diagram
- Figure 3-2. DAQCard-6024E Block Diagram
- Figure 3-3. Dithering
- Figure 3-4. CONVERT* Signal Routing
- Figure 3-5. PCI RTSI Bus Signal Connection
- Figure 3-6. PXI RTSI Bus Signal Connection
- Figure 4-1. I/O Connector Pin Assignment for the 6023E/6024E
- Figure 4-2. I/O Connector Pin Assignment for the 6025E
- Figure 4-3. Programmable Gain Instrumentation Amplifier (PGIA)
- Figure 4-4. Summary of Analog Input Connections
- Figure 4-5. Differential Input Connections for Ground Referenced Signals
- Figure 4-6. Differential Input Connections for Nonreferenced Signals
- Figure 4-7. Single Ended Input Connections for Nonreferenced or Floating Signals
- Figure 4-8. Single Ended Input Connections for Ground Referenced Signals
- Figure 4-9. Analog Output Connections
- Figure 4-10. Digital I/O Connections
- Figure 4-11. Digital I/O Connections Block Diagram
- Figure 4-12. DIO Channel Configured for High DIO Power-up State with External Load
- Figure 4-13. Timing Specifications for Mode 1 Input Transfer
- Figure 4-14. Timing Specifications for Mode 1 Output Transfer
- Figure 4-15. Timing Specifications for Mode 2 Bidirectional Transfer
- Figure 4-16. Timing I/O Connections
- Figure 4-17. Typical Posttriggered Acquisition
- Figure 4-18. Typical Pretriggered Acquisition
- Figure 4-19. SCANCLK Signal Timing
- Figure 4-20. EXTSTROBE* Signal Timing
- Figure 4-21. TRIG1 Input Signal Timing
- Figure 4-22. TRIG1 Output Signal Timing
- Figure 4-23. TRIG2 Input Signal Timing
- Figure 4-24. TRIG2 Output Signal Timing
- Figure 4-25. STARTSCAN Input Signal Timing
- Figure 4-26. STARTSCAN Output Signal Timing
- Figure 4-27. CONVERT* Input Signal Timing
- Figure 4-28. CONVERT* Output Signal Timing
- Figure 4-29. SISOURCE Signal Timing
- Figure 4-30. WFTRIG Input Signal Timing
- Figure 4-31. WFTRIG Output Signal Timing
- Figure 4-32. UPDATE* Input Signal Timing
- Figure 4-33. UPDATE* Output Signal Timing
- Figure 4-34. UISOURCE Signal Timing
- Figure 4-35. GPCTR0_SOURCE Signal Timing
- Figure 4-36. GPCTR0_GATE Signal Timing in Edge Detection Mode
- Figure 4-37. GPCTR0_OUT Signal Timing
- Figure 4-38. GPCTR1_SOURCE Signal Timing
- Figure 4-39. GPCTR1_GATE Signal Timing in Edge Detection Mode
- Figure 4-40. GPCTR1_OUT Signal Timing
- Figure 4-41. GPCTR Timing Summary
- Figure B-1. 68 Pin E Series Connector Pin Assignments
- Figure B-2. 68 Pin Extended Digital Input Connector Pin Assignments
- Figure B-3. 50 Pin E Series Connector Pin Assignments
- Figure B-4. 50-Pin Extended Digital Input Connector Pin Assignments
- Tables
- Table 3-1. Available Input Configurations
- Table 3-2. Measurement Precision
- Table 3-3. Pins Used by PXI E Series Device
- Table 4-1. I/O Connector Details
- Table 4-2. I/O Connector Signal Descriptions
- Table 4-3. I/O Signal Summary
- Table 4-4. Port C Signal Assignments
- Table 4-5. Signal Names Used in Timing Diagrams
Chapter 4 Signal Connections
© National Instruments Corporation 4-39 6023E/6024E/6025E User Manual
Figure 4-28. CONVERT* Output Signal Timing
The sample interval counter on the device normally generates the
CONVERT* signal unless you select some external source. The counter is
started by the STARTSCAN signal and continues to count down and reload
itself until the scan is finished. It then reloads itself in preparation for the
next STARTSCAN pulse.
A/D conversions generated by either an internal or external CONVERT*
signal are inhibited unless they occur within a DAQ sequence. Scans
occurring within a DAQ sequence can be gated by either the hardware
(AIGATE) signal or software command register gate.
AIGATE Signal
Any PFI pin can externally input the AIGATE signal, which is not
available as an output on the I/O connector. The AIGATE signal can
mask off scans in a DAQ sequence. You can configure the PFI pin you
select as the source for the AIGATE signal in either the level-detection or
edge-detection mode. You can configure the polarity selection for the
PFI pin for either active high or active low.
In the level-detection mode if AIGATE is active, the STARTSCAN signal
is masked off and no scans can occur. In the edge-detection mode, the first
active edge disables the STARTSCAN signal, and the second active edge
enables STARTSCAN.
The AIGATE signal can neither stop a scan in progress nor continue a
previously gated-off scan; in other words, once a scan has started, AIGATE
does not gate off conversions until the beginning of the next scan and,
conversely, if conversions are gated off, AIGATE does not gate them back
on until the beginning of the next scan.
t
w
t
w
= 50-150 ns