User's Manual

Table Of Contents
42 novatelwireless.com
USIM Parameter/Conditions Min Typ Max Units
VDD SIM VDD voltage 1.65 1.8 1.95 V
2.7 2.85 2.95 V
VIH High level input voltage 1.15 V
VIL Low level input voltage 0.61 V
VOH High level output voltage, IO = 4 mA Vdd-0.45 V
VOL Low level output voltage, IO = 1 mA 0.4 V
II Input leakage current ±1 μA
Iout Output current 4 mA
PU PU resistance 32 k
PD PD resistance 30 k
Iz Leakage current ± 30 μA
Card Detect Debouncing time (SIM-card insertion) 0.5 mS
Debouncing time (SIM-card extraction) 15 mS
Pull-up resistor (resistor + resistive switch) 475 k
Remote SIM Component Information
Any compatible SIM carrier can be used in conjunction with the Enabler IIIG module. For
example:
Lumberg P/N 8840_A_21.
or Suyin P/N: 254016MA006G103ZL
Remote SIM Example
ESD protection is required for all SIM sockets. A Transient Voltage Suppressor (TVS) diode
with low capacitance, typically less than 10pF, should be used. ESD protection is required for
PTCRB and GCF approval and should be located as close to the connector as possible. Signal
lines from the connector to the modem should be routed 'through' the pad of the diode,
rather than a 'T' branch. Decoupling capacitance on SIM_VDD will be required, and should be
placed as close to the SIM connector as possible. The value of the required capacitor will vary
by design, and will typically be below 0.1uF. The SIM electrical tests will be conducted during
the PTCRB and GCF approval process. Experimentation of the capacitance value may be
required to pass these tests. Factors affecting the capacitance of the SIM_VDD line include:
trace length, capacitance of the TVS diode, and physical placement of the capacitor.