Datasheet

74AUP1G04 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 7 — 27 June 2012 11 of 22
NXP Semiconductors
74AUP1G04
Low-power inverter
[1] For measuring enable and disable times R
L
= 5 kΩ, for measuring propagation delays, setup and hold times and pulse width R
L
= 1 MΩ.
Test data is given in Table 11
.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator
V
EXT
= External voltage for measuring switching times.
Fig 9. Load circuitry for switching times
001aac521
DUT
R
T
V
I
V
O
V
EXT
V
CC
R
L
5 kΩ
C
L
G
Table 11. Test data
Supply voltage Load V
EXT
V
CC
C
L
R
L
[1]
t
PLH
, t
PHL
t
PZH
, t
PHZ
t
PZL
, t
PLZ
0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 kΩ or 1 MΩ open GND 2 × V
CC