Datasheet

74CBTLV3253 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 4 — 15 December 2011 11 of 19
NXP Semiconductors
74CBTLV3253
Dual 1-of-4 multiplexer/demultiplexer
Test data is given in Table 10.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 16. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aae331
V
EXT
V
CC
V
I
V
O
DUT
C
L
R
T
R
L
R
L
G
Table 10. Test data
Supply voltage Load V
EXT
V
CC
C
L
R
L
t
PLH
, t
PHL
t
PZH
, t
PHZ
t
PZL
, t
PLZ
2.3 V to 2.7 V 30 pF 500  open GND 2V
CC
3.0 V to 3.6 V 50 pF 500  open GND 2V
CC