Datasheet

74CBTLV3253 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 4 — 15 December 2011 5 of 19
NXP Semiconductors
74CBTLV3253
Dual 1-of-4 multiplexer/demultiplexer
9. Static characteristics
[1] All typical values are measured at T
amb
=25C.
[2] One input at 3 V, other inputs at V
CC
or GND.
9.1 Test circuits
Table 6. Static characteristics
At recommended operating conditions voltages are referenced to GND (ground = 0 V).
Symbol Parameter Conditions T
amb
= 40 C to +85 C T
amb
= 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
V
IH
HIGH-level
input voltage
V
CC
= 2.3 V to 2.7 V 1.7 - - 1.7 - V
V
CC
= 3.0 V to 3.6 V 2.0 - - 2.0 - V
V
IL
LOW-level input
voltage
V
CC
= 2.3 V to 2.7 V - - 0.7 - 0.7 V
V
CC
= 3.0 V to 3.6 V - - 0.9 - 0.9 V
I
I
input leakage
current
pin nOE; V
I
= GND to V
CC
;
V
CC
=3.6V
--1- 20 A
I
S(OFF)
OFF-state
leakage current
V
CC
= 3.6 V; see Figure 5 --1- 20 A
I
S(ON)
ON-state
leakage current
V
CC
= 3.6 V; see Figure 6 --1- 20 A
I
OFF
power-off
leakage current
V
I
or V
O
= 0 V to 3.6 V;
V
CC
=0V
--10 - 50 A
I
CC
supply current V
I
= GND or V
CC
; I
O
= 0 A;
V
SW
=GNDorV
CC
;
V
CC
=3.6V
--10- 50A
I
CC
additional
supply current
pin nOE; V
I
=V
CC
0.6 V;
V
SW
=GNDorV
CC
;
V
CC
=3.6V
[2]
- - 300 - 2000 A
C
I
input
capacitance
pin nOE; V
CC
= 3.3 V;
V
I
=0Vto3.3 V
-0.9- - -pF
C
S(OFF)
OFF-state
capacitance
V
CC
= 3.3 V; V
I
=0Vto3.3 V - 5.2 - - - pF
C
S(ON)
ON-state
capacitance
V
CC
= 3.3 V; V
I
= 0 V to 3.3 V - 20.0 - - - pF
V
I
= V
CC
or GND and V
O
= GND or V
CC
.V
I
= V
CC
or GND and V
O
= open circuit.
Fig 5. Test circuit for measuring OFF-state leakage
current (one switch)
Fig 6. Test circuit for measuring ON-state leakage
current (one switch)
001aai101
nBn
nOE
V
IH
nA
GND
V
CC
V
l
V
O
I
s
A
I
s
A
001aai103
nA
nOE
V
IL
nBn
GND
V
CC
V
l
V
O
I
s
A