Datasheet

74HC_HCT595 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 7 — 26 January 2015 15 of 24
NXP Semiconductors
74HC595; 74HCT595
8-bit serial-in, serial or parallel-out shift register with output latches; 3-state
Test data is given in Table 9.
Definitions for test circuit:
C
L
= load capacitance including jig and probe capacitance.
R
L
= load resistance.
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
S1 = test selection switch.
Fig 14. Test circuit for measuring switching times
9
0
9
0
W
:
W
:


9
9
,
9
,
QHJDWLYH
SXOVH
SRVLWLYH
SXOVH
9
9
0
9
0


W
I
W
U
W
U
W
I
DDG
'87
9
&&
9
&&
9
,
9
2
5
7
 5
/
6
&
/
RSHQ
*
Table 9. Test data
Type Input Load S1 position
V
I
t
r
, t
f
C
L
R
L
t
PHL
, t
PLH
t
PZH
, t
PHZ
t
PZL
, t
PLZ
74HC595 V
CC
6 ns 50 pF 1 k open GND V
CC
74HCT595 3 V 6 ns 50 pF 1 k open GND V
CC