Datasheet

74LVC1G02 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 11 — 29 June 2012 7 of 19
NXP Semiconductors
74LVC1G02
Single 2-input NOR gate
12. Waveforms
Measurement points are given in Table 9.
V
OL
and V
OH
are typical output voltage levels that occur with the output.
Fig 8. The input (A, B) to output (Y) propagation delay times
mna612
t
PHL
t
PLH
V
M
V
M
A, B input
Y output
GND
V
I
V
OH
V
OL
Table 9. Measurement points
Supply voltage Input Output
V
CC
V
M
V
M
1.65 V to 1.95 V 0.5V
CC
0.5V
CC
2.3 V to 2.7 V 0.5V
CC
0.5V
CC
2.7V 1.5V 1.5V
3.0V to 3.6V 1.5V 1.5V
4.5 V to 5.5 V 0.5V
CC
0.5V
CC
Test data is given in Table 10.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 9. Test circuit for measuring switching times
V
EXT
V
CC
V
I
V
O
mna616
DUT
C
L
R
T
R
L
R
L
G