Datasheet

74LVC2G74 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 10 — 2 April 2013 13 of 25
NXP Semiconductors
74LVC2G74
Single D-type flip-flop with set and reset; positive edge trigger
Test data is given in Table 11.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 10. Test circuit for measuring switching times
V
EXT
V
CC
V
I
V
O
mna616
DUT
C
L
R
T
R
L
R
L
G
Table 11. Test data
Supply voltage Input Load V
EXT
V
CC
V
I
t
r
, t
f
C
L
R
L
t
PLH
, t
PHL
t
PZH
, t
PHZ
t
PZL
, t
PLZ
1.65 V to 1.95 V V
CC
 2.0ns 30pF 1k open GND 2V
CC
2.3 V to 2.7 V V
CC
 2.0 ns 30 pF 500  open GND 2V
CC
2.7 V 2.7 V  2.5 ns 50 pF 500  open GND 6 V
3.0 V to 3.6 V 2.7 V  2.5 ns 50 pF 500  open GND 6 V
4.5 V to 5.5 V V
CC
 2.5 ns 50 pF 500  open GND 2V
CC