Datasheet

74LVCV2G66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 5 — 29 March 2013 13 of 23
NXP Semiconductors
74LVCV2G66
Overvoltage tolerant bilateral switch
11.3 Test circuits
Test conditions:
V
CC
= 2.3 V: V
i
= 2 V (p-p).
V
CC
= 3 V: V
i
= 2.5 V (p-p).
V
CC
= 4.5 V: V
i
= 4 V (p-p).
Fig 14. Test circuit for measuring total harmonic distortion
001aag492
V
IH
V
O
V
CC
0.5V
CC
nZ/nYnY/nZ
nE
600 Ωf
i
R
L
10 μF
C
L
D
Adjust f
i
voltage to obtain 0 dBm level at output. Increase f
i
frequency until dB meter reads 3dB.
Fig 15. Test circuit for measuring the frequency response when switch is in ON-state
001aag491
V
IH
V
O
V
CC
0.5V
CC
nZ/nYnY/nZ
nE
50 Ωf
i
R
L
0.1 μF
C
L
dB
Adjust f
i
voltage to obtain 0 dBm level at input.
Fig 16. Test circuit for measuring isolation (OFF-state)
001aag493
V
IL
V
O
V
CC
0.5V
CC
nZ/nYnY/nZ
nE
50 Ωf
i
R
L
0.5V
CC
R
L
0.1 μF
C
L
dB