Datasheet

2003 Dec 17 6
NXP Semiconductors Product data sheet
High-speed diode BAL74
handbook, full pagewidth
t
rr
(1)
I
F
t
output signal
t
r
t
t
p
10%
90%
V
R
input signal
V = V I x R
RF S
R = 50
S
Ω
I
F
D.U.T.
R = 50
i
Ω
SAMPLING
OSCILLOSCOPE
MGA881
Fig.7 Reverse recovery time test circuit and waveforms.
(1) I
R
= 1 mA.
t
r
t
t
p
10%
90%
I
input
signal
R = 50
S
Ω
I
R = 50
i
Ω
OSCILLOSCOPE
Ω1 k Ω450
D.U.T.
MGA882
V
fr
t
output
signal
V
Fig.8 Forward recovery voltage test circuit and waveforms.