Datasheet

NXP Semiconductors
BT134-600E
4Q Triac
BT134-600E All information provided in this document is subject to legal disclaimers. © NXP N.V. 2013. All rights reserved
Product data sheet 21 November 2013 8 / 13
T
j
(°C)
- 60 14090- 10 40
003aae833
1
2
3
0
(1)
(2)
(3)
(4)
(1)
(2)
(3)
(4)
I
GT
I
GT
(25 °C)
(1) T2- G+
(2) T2- G-
(3) T2+ G-
(4) T2+ G+
Fig. 7. Normalized gate trigger current as a function of
junction temperature
T
j
(°C)
- 60 14090- 10 40
003aae835
1
2
3
0
I
L
I
L(25°C)
Fig. 8. Normalized latching current as a function of
junction temperature
T
j
(°C)
- 60 14090- 10 40
003aae837
1.0
0.5
1.5
2.0
0
I
H
I
H(25°C)
Fig. 9. Normalized holding current as a function of
junction temperature
V
T
(V)
0 321
003aae834
4
8
12
I
T
(A)
0
(1)
(2) (3)
V
o
= 1.27 V
R
s
= 0.091 Ω
(1) T
j
= 125 °C; typical values
(2) T
j
= 125 °C; maximum values
(3) T
j
= 25 °C; maximum values
Fig. 10. On-state current as a function of on-state
voltage