Datasheet

HEF4014B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 8 — 21 November 2011 8 of 14
NXP Semiconductors
HEF4014B
8-bit static shift register
Table 9. Measurement points
Supply voltage Input Output
V
DD
V
M
V
M
5 V to 15 V 0.5V
DD
0.5V
DD
Test data is given in Table 10;
Definitions for test circuit:
DUT = Device Under Test.
C
L
= load capacitance including jig and probe capacitance.
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
Fig 6. Test circuit
V
DD
V
I
V
O
001aag182
DUT
C
L
R
T
G
Table 10. Test data
Supply voltage Input Load
V
DD
V
I
t
r
, t
f
C
L
5 V to 15 V V
SS
or V
DD
 20 ns 50 pF