Datasheet

IP4085_4385_4386_4387_CX4 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 2 — 14 December 2012 10 of 18
NXP Semiconductors
IP4085/4385/4386/4387/CX4
Integrated high-performance ESD protection diodes
Measurements are done on a heat-dissipation optimized PCB with massive copper area
under the Device Under Test (DUT).
(1) T
amb
= +25 C.
(2) T
amb
= +85 C.
(3) T
amb
= 30 C.
(1) T
amb
= +25 C.
(2) T
amb
= +85 C.
(3) T
amb
= 30 C.
Fig 15. IP4386CX4: peak clamping voltage as a
function of reverse current
Fig 16. IP4387CX4: peak clamping voltage as a
function of reverse current
006aad230
I
R
(A)
0.3 1.51.10.7
17
18
19
V
CL
(V)
16
(2)
(1)
(3)
006aad231
I
R
(A)
0.4 1.61.20.8
11.4
11.8
12.2
V
CL
(V)
11.0
(2)
(1)
(3)