Datasheet

LPC1102_1104 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 7 — 26 September 2013 21 of 43
NXP Semiconductors
LPC1102/1104
32-bit ARM Cortex-M0 microcontroller
[1] The ADC is monotonic, there are no missing codes.
[2] The differential linearity error (E
D
) is the difference between the actual step width and the ideal step width. See Figure 5.
[3] The integral non-linearity (E
L(adj)
) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 5
.
[4] The offset error (E
O
) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 5
.
[5] The gain error (E
G
) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 5
.
[6] The absolute error (E
T
) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve. See Figure 5
.
[7] T
amb
= 25 C; maximum sampling frequency f
s
= 400 kSamples/s and analog input capacitance C
ia
= 1 pF.
[8] Input resistance R
i
depends on the sampling frequency f
s
: R
i
= 1 / (f
s
 C
ia
).
Table 6. ADC static characteristics
T
amb
=  40  C to +85  C unless otherwise specified; ADC frequency 4.5 MHz, V
DD
= 2.5 V to 3.6 V.
Symbol Parameter Conditions Min Typ Max Unit
V
IA
analog input voltage 0 - V
DD
V
C
ia
analog input capacitance - - 1 pF
E
D
differential linearity error
[1][2]
--1LSB
E
L(adj)
integral non-linearity
[3]
--1.5 LSB
E
O
offset error
[4]
--3.5 LSB
E
G
gain error
[5]
--0.6%
E
T
absolute error
[6]
--4LSB
R
vsi
voltage source interface
resistance
--40k
R
i
input resistance
[7][8]
--2.5M