Datasheet

LPC1759_58_56_54_52_51 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 8.5 — 24 June 2014 71 of 80
NXP Semiconductors
LPC1759/58/56/54/52/51
32-bit ARM Cortex-M3 microcontroller
15.6 ElectroMagnetic Compatibility (EMC)
Radiated emission measurements according to the IEC61967-2 standard using the
TEM-cell method are shown for part LPC1768.
[1] IEC levels refer to Appendix D in the IEC61967-2 Specification.
Table 24. ElectroMagnetic Compatibility (EMC) for part LPC1768 (TEM-cell method)
V
DD
= 3.3 V; T
amb
= 25  C.
Parameter Frequency band System clock = Unit
12 MHz 24 MHz 48 MHz 72 MHz 100 MHz
Input clock: IRC (4 MHz)
maximum
peak level
150 kHz to 30 MHz 7 6 4 7 7dBV
30 MHz to 150 MHz +1 +5 +11 +16 +9 dBV
150 MHz to 1 GHz 2 +4 +11 +12 +19 dBV
IEC level
[1]
-OONML-
Input clock: crystal oscillator (12 MHz)
maximum
peak level
150 kHz to 30 MHz 5 4 4 7 8dBV
30 MHz to 150 MHz 1+5 +10+15+7 dBV
150 MHz to 1 GHz 1 +6 +11 +10 +16 dBV
IEC level
[1]
-OONMM-