Datasheet

LPC2194 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 6 — 14 June 2011 33 of 41
NXP Semiconductors
LPC2194
Single-chip 16/32-bit microcontroller
Test conditions: Power-down mode entered executing code from on-chip flash.
Fig 11. Typical LPC2194/01 core power-down current I
DD(pd)
measured at different temperatures
0
100
200
300
400
500
1.65 V
1.8 V
1.95 V
002aad124
-40 -25 -10 5 20 35 50 65 80 95 110 125
temperature (°C)
I
DD(pd)
(μA)
Test conditions: code executed from on-chip flash; PCLK =
CCLK
⁄
4
;
core voltage 1.8 V; all peripherals disabled.
Fig 12. Typical LPC2194/01 I
DD(act)
measured at different temperatures
002aad125
-40 -25 -10 5 20 35 50 65 80 95 110 125
12 MHz
48 MHz
60 MHz
5
15
25
35
45
temperature (°C)
I
DD(act)
(mA)