- NXP ARM Microcontroller Product Data Sheet

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LPC2917_19_1 © NXP B.V. 2007. All rights reserved.
Preliminary data sheet Rev. 1.01 — 15 November 2007 55 of 68
NXP Semiconductors
LPC2917/19
ARM9 microcontroller with CAN and LIN
[1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
amb
= 125 °C on wafer
level. Cased products are tested at T
amb
=25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover
the specified temperature and power-supply voltage range.
[2] Leakage current is exponential to temperature; worst-case value is at 125 C Tvj. All clocks off. Analog modules and FLASH powered
down.
[3] For Port 0, pin 0 to pin 15 add maximum 1.5 pF for input capacitance to ADC. For Port 0, pin 16 to pin 31 add maximum 1.0 pF for input
capacitance to ADC.
[4] This value is the minimum drive capability. Maximum short-circuit output current is 33 mA (drive HIGH-level, shorted to ground) or
−38 mA. (drive LOW-level, shorted to V
DD(IO)
). The device will be damaged if multiple outputs are shorted.
[5] C
xtal
is crystal load capacitance and C
ext
are the two external load capacitors.
[6] The power-up reset has a time filter: V
DD(CORE)
must be above V
trip(high)
for 2 μs before reset is de-asserted; V
DD(CORE)
must be below
V
trip(low)
for 11 μs before internal reset is asserted.
[7] Not 5 V-tolerant when pull-up is on.
[8] For I/O Port 0, the maximum input voltage is defined by V
I(ADC)
.
[9] This parameter is not part of production testing or final testing, hence only a typical value is stated. Maximum and minimum values are
based on simulation results.
12. Dynamic characteristics
Oscillator
R
s(xtal)
Crystal series resistance. f
osc
= 10 MHz to 15 MHz
[5]
C
xtal
=10pF;
C
ext
=18pF
--160Ω
C
xtal
=20pF;
C
ext
=39pF
--60Ω
f
osc
= 15 MHz to 20 MHz
[5]
C
xtal
=10pF;
C
ext
=18pF
--80Ω
C
i
Input capacitance of
XIN_OSC.
[9]
-2pF
Power-up reset
V
trip(high)
High trip-level voltage.
[6]
1.2 1.4 1.6 V
V
trip(low)
Low trip-level voltage.
[6]
1.1 1.3 1.5 V
V
trip(dif)
Difference between high
and low trip-level
voltages.
[6]
50 120 180 mV
Table 30. Static characteristics
…continued
V
DD(CORE)
=V
DD(OSC_PLL)
; V
DD(IO)
= 2.7 V to 3.6 V; V
DD(A3V3)
= 3.0 V to 3.6 V; T
vj
=-40 ° Cto+125 ° C; all voltages are
measured with respect to ground; positive currents flow into the IC; unless otherwise specified.
[1]
Symbol Parameter Conditions Min Typ Max Unit
Table 31. Dynamic characteristics
V
DD(CORE)
=V
DD(OSC_PLL)
; V
DD(IO)
= 2.7 V to 3.6 V; V
DD(A3V3)
= 3.0 V to 3.6 V; T
vj
= − 40 ° C; all voltages are measured with
respect to ground; positive currents flow into the IC; unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
I/O pins
t
THL
HIGH-to-LOW
transition time.
C
L
= 30 pF 4 - 13.8 ns
t
TLH
LOW-to-HIGH
transition time.
C
L
= 30 pF 4 - 13.8 ns