Datasheet

DR
AFT
DR
AFT
DRAFT
DR
D
RAFT
DRAFT
DRA
F
T DRAF
D
RAFT DRAFT DRAFT DRAFT DRAFT D
DRAFT
D
RAFT DRA
F
T DRAFT DRAFT DRAFT DRA
LPC3152_3154 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Preliminary data sheet Rev. 0.12 — 27 May 2010 77 of 88
NXP Semiconductors
LPC3152/3154
10.2.5 USB interface
[1] Characterized but not implemented as production test. Guaranteed by design.
10.2.6 10-bit ADC
Table 32. Dynamic characteristics: USB pins (high-speed)
C
L
= 50 pF; R
pu
= 1.5 k Ω on D+ to V
DD(IO)
(SUP3), unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
t
r
rise time 10 % to 90 % <tbd> - <tbd> ns
t
f
fall time 10 % to 90 % <tbd> - <tbd> ns
t
FRFM
differential rise and fall time
matching
t
r
/t
f
--<tbd>%
V
CRS
output signal crossover voltage <tbd> - <tbd> V
t
FEOPT
source SE0 interval of EOP see Figure 34 <tbd> - <tbd> ns
t
FDEOP
source jitter for differential transition
to SE0 transition
see Figure 34 <tbd> - <tbd> ns
t
JR1
receiver jitter to next transition <tbd> - <tbd> ns
t
JR2
receiver jitter for paired transitions 10 % to 90 % <tbd> - <tbd> ns
t
EOPR1
EOP width at receiver must reject as
EOP; see
Figure 34
[1]
<tbd>--ns
t
EOPR2
EOP width at receiver must accept as
EOP; see
Figure 34
[1]
<tbd>--ns
Fig 34. Differential data-to-EOP transition skew and EOP width
002aab561
t
PERIOD
differential
data lines
crossover point
source EOP width: t
FEOPT
receiver EOP width: t
EOPR1
, t
EOPR2
crossover point
extended
differential data to
SE0/EOP skew
n × t
PERIOD
+ t
FDEOP
Table 33: Dynamic characteristics: 10-bit ADC
Symbol Parameter Conditions Min Typ Max Unit
f
s
sampling frequency 10 bit resolution 400 - - kSamples/s
2 bit resolution - - 1500 kSamples/s
t
conv
conversion time 10 bit resolution - - 11 clock cycles
2 bit resolution 3 - - clock cycles