Datasheet

56F8355 Technical Data, Rev. 17
2 Freescale Semiconductor
Preliminary
Document Revision History
Version History Description of Change
Rev 0.0
Initial release
Rev 1.0
Fixed typos in Section 1.1.3; Replace any reference to Flash Interface Unit with Flash
Memory Module; added note to Vcap pin in Table 2-2; corrected Table 4-4, removed
unneccessary notes in Table 10-12; corrected temperature range in Table 10-14; added
ADC calibration information to Table 10-23 and new graphs in Figure 10-22
Rev 2.0
Corrected 2.2μF to 0.1 μF low ESR capacitor in Table 2-2. Replaced Table 10-16 with
correct parameters for the 128 package pinout. Corrected (fout/2) with (fout) in Table 10-14.
Corrected pinout labels in Figure 11-1.
Rev 3.0
Adding/clarifing notes to Table 4-4 to help clarify independent program flash blocks and
other Program Flash modes, clarification to Table 10-22, corrected Digital Input Current Low
(pullup enabled) numbers in Table 10-5. Removed text and Table 10-2; replaced with note to
Table 10-1.
Rev 4.0
Correcting Table 4-6 Address locations.
Rev 5.0 Added 56F8155 information; edited to indicate differences in 56F8355 and 56F8155. Refor-
matted for Freescale look and feel. Updated Temperature Sensor and ADC tables, then
updated balance of electrical tables for consistency throughout the family. Clarified I/O power
description in Table 2-2, added note to Table 10-7 and clarified Section 12.3.
Rev 6.0 Added output voltage maximum value and note to clarify in Table 10-1; also removed overall
life expectancy note, since life expectancy is dependent on customer usage and must be
determined by reliability engineering. Clarified value and unit measure for Maximum allowed
P
D
in Table 10-3. Corrected note about average value for Flash Data Retention in
Table 10-4. Added new RoHS-compliant orderable part numbers in Table 13-1.
Rev 7.0 Updated Table 10-23 to reflect new value for maximum Uncalibrated Gain Error
Rev 8.0 Deleted RSTO from Pin Group 2 (listed after Table 10-1). Deleted formula for Max Ambient
Operating Temperature (Automotive) and Max Ambient Operating Temperature (Industrial)
in Table 10-4. Added RoHS-compliance and “pb-free” language to back cover.
Rev 9.0
Added information/corrected state during reset in Table 2-2. Clarified external reference
crystal frequency for PLL in Table 10-14 by increasing maximum value to 8.4MHz.
Rev 10.0
Replaced “Tri-stated” with an explanation in State During Reset column in Table 2-2.
Rev 11.0
Corrected bootflash memory map layout in Table 4-4 to 16KB.
Rev. 12
• Added the following note to the description of the TMS signal in Table 2-2:
Note: Always tie the TMS pin to V
DD
through a 2.2K resistor.
• Added the following note to the description of the TRST
signal in Table 2-2:
Note: For normal operation, connect TRST
directly to V
SS
. If the design is to be used in a
debugging environment, TRST
may be tied to V
SS
through a 1K resistor.
Please see http://www.freescale.com for the most current data sheet revision.