Datasheet

56F8365 Technical Data, Rev. 9
148 Freescale Semiconductor
10.3 AC Electrical Characteristics
Tests are conducted using the input levels specified in Table 10-5. Unless otherwise specified,
propagation delays are measured from the 50% to the 50% point, and rise and fall times are measured
between the 10% and 90% points, as shown in Figure 10-2.
Figure 10-2 Input Signal Measurement References
Figure 10-3 shows the definitions of the following signal states:
Active state, when a bus or signal is driven, and enters a low impedance state
Tri-stated, when a bus or signal is placed in a high impedance state
Data Valid state, when a signal level has reached V
OL
or V
OH
Data Invalid state, when a signal level is in transition between V
OL
and V
OH
Figure 10-3 Signal States
10.4 Flash Memory Characteristics
Table 10-12 Flash Timing Parameters
Characteristic Symbol Min Typ Max Unit
Program time
1
1. There is additional overhead which is part of the programming sequence. See the 56F8300 Peripheral User Manual
for details. Program time is per 16-bit word in Flash memory. Two words at a time can be programmed within the Pro-
gram Flash module, as it contains two interleaved memories.
Tprog
20 s
Erase time
2
Terase
20 ms
Mass erase time
Tme
100 ms
V
IH
V
IL
Fall Time
Input Signal
Note: The midpoint is V
IL
+ (V
IH
– V
IL
)/2.
Midpoint1
Low High
90%
50%
10%
Rise Time
Data Invalid State
Data1
Data2 Valid
Data
Tri-stated
Data3 Valid
Data2 Data3
Data1 Valid
Data Active Data Active