Datasheet

Appendix A Electrical Characteristics and Timing Specifications
MC9S08AW60 Data Sheet, Rev 2
308 Freescale Semiconductor
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
the table.
The susceptibility performance classification is described in Table A-19.
Table A-18. Conducted Susceptibility
Parameter Symbol Conditions
f
OSC
/f
BUS
Result
Amplitude
1
(Min)
1
Data based on qualification test results. Not tested in production.
Unit
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V
CS_EFT
V
DD
= 5.5V
T
A
= +25
o
C
package type
64 QFP
32768 Hz
crystal
2 MHz Bus
A
±0
±2.0
2
2
The RESET pin is susceptible to the minimum applied transient of 220 V. All other pins have a result of A up to a minimum of
2000V.
kV
B ±2.5
C ±3.0
D>±3.0
Table A-19. Susceptibility Performance Classification
Result Performance Criteria
A No failure The MCU performs as designed during and after exposure.
B Self-recovering
failure
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
C Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E Damage The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.