Datasheet

Electrical Characteristics
MC9S08GT16A/GT8A Data Sheet, Rev. 1
Freescale Semiconductor 273
7
Ideal resolution (1 LSB)
5
2.08V < V
DDAD
< 3.6V RES 2.031 3.516 mV
1.80V
< V
DDAD
< 2.08V 1.758 2.031
Differential non-linearity
6
1.80V < V
DDAD
< 3.6V
DNL
+0.5 +1.0 LSB8
9
Integral non-linearity
7
1.80 V < V
DDAD
< 3.6V
INL
+0.5 +1.0 LSB
Zero-scale error
8
1.80V < V
DDAD
< 3.6V
E
ZS
+0.4 +1.0 LSB10
Full-scale error
9
1.80V < V
DDAD
< 3.6V
E
FS
+0.4 +1.0 LSB11
Input leakage error
10
1.80V < V
DDAD
< 3.6V
E
IL
+0.05 +5 LSB12
13
Total unadjusted
error
11
1.80V < V
DDAD
< 3.6V
E
TU
+1.1 +2.5 LSB
14 Input resistance R
AIN
—5 7 k
15 Input capacitance C
AIN
25 pF
1
All ACCURACY numbers are based on processor and system being in WAIT state (very little activity and no IO switching) and that
adequate low-pass filtering is present on analog input pins (filter with 0.01 µF to 0.1 µF capacitor between analog input and V
REFL
).
Failure to observe these guidelines may result in system or microcontroller noise causing accuracy errors which will vary based
on board layout and the type and magnitude of the activity.
2
This is the conversion time for subsequent conversions in continuous convert mode. Actual conversion time for single conversions
or the first conversion in continuous mode is extended by one ATD clock cycle and 2 bus cycles due to starting the conversion and
setting the CCF flag. The total conversion time in Bus Cycles for a conversion is:
SC Bus Cycles = ((PRS+1)*2) * (28+1) + 2 CC Bus Cycles = ((PRS+1)*2) * (28)
3
R
AS
is the real portion of the impedance of the network driving the analog input pin. Values greater than this amount may not fully
charge the input circuitry of the ATD resulting in accuracy error.
4
Analog input must be between V
REFL
and V
REFH
for valid conversion. Values greater than V
REFH
will convert to $3FF less the full
scale error (E
FS
).
5
The resolution is the ideal step size or 1LSB = (V
REFH
–V
REFL
)/1024
6
Differential non-linearity is the difference between the current code width and the ideal code width (1LSB). The current code width
is the difference in the transition voltages to and from the current code.
7
Integral non-linearity is the difference between the transition voltage to the current code and the adjusted ideal transition voltage
for the current code. The adjusted ideal transition voltage is (Current Code–1/2)*(1/((V
REFH
+E
FS
)–(V
REFL
+E
ZS
))).
8
Zero-scale error is the difference between the transition to the first valid code and the ideal transition to that code. The Ideal
transition voltage to a given code is (Code–1/2)*(1/(V
REFH
–V
REFL
)).
9
Full-scale error is the difference between the transition to the last valid code and the ideal transition to that code. The ideal
transition voltage to a given code is (Code–1/2)*(1/(V
REFH
–V
REFL
)).
10
Input leakage error is error due to input leakage across the real portion of the impedance of the network driving the analog pin.
Reducing the impedance of the network reduces this error.
11
Total unadjusted error is the difference between the transition voltage to the current code and the ideal straight-line transfer
function. This measure of error includes inherent quantization error (1/2LSB) and circuit error (differential, integral, zero-scale, and
full-scale) error. The specified value of E
T
assumes zero E
IL
(no leakage or zero real source impedance).
Table A-9. ATD Timing/Performance Characteristics
1
(continued)
No. Characteristic Condition Symbol Min Typ Max Unit