Datasheet

Appendix A Electrical Characteristics
MC9S08LC60 Series Data Sheet: Technical Data, Rev. 4
Freescale Semiconductor 349
A.12.2 Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient signal on each pin of the
microcontroller. The transient waveform and injection methodology is in accordance with IEC 61000-4-4
for the electrical fast transient/burst (EFT/B). The transient voltage required to cause performance
degradation on any pin in the tested configuration is greater than or equal to the reported levels unless
otherwise indicated by footnotes below the table.
The susceptibility performance classification is described in Table A-18.
Table A-17. Conducted Transient Susceptibility Characteristics
1
Package
Supply
Voltage
[V]
Ambient
Temp.
[
o
C]
Oscillator
Source &
Frequency
System Bus
Frequency
Result
Amplitude
Level
[Typical]
2
Unit
80LQFP 2.2 25
External crystal,
32 kHz
20 MHz
A +/- 4
kV
B none
C none
D none
E
none
NOTES:
1. This data based on qualification test results. Not tested in production.
2. The reported transient immunity voltage ;levels indicate the minimum voltage range for each result type.
Table A-18. Susceptibility Performance Classification
Result Performance Criteria
A No failure The MCU performs as designed during and after exposure.
B Self-recovering
failure
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
C Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E Damage The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.