Datasheet

MC9S08LG32 Series Data Sheet, Rev. 9
Ordering Information
Freescale Semiconductor38
The susceptibility performance classification is described in Table 21.
3 Ordering Information
This section contains ordering information for MC9S08LG32 and MC9S08LG16 devices.
Table 21. Susceptibility Performance Classification
Result Performance Criteria
A No failure The MCU performs as designed during and after exposure.
B Self-recovering
failure
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
C Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E Damage The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
Table 22. Device Numbering System
Device Number
1
1
See the MC9S08LG32 Reference Manual (document MC9S08LG32RM), for a complete description of modules included on
each device.
Memory
Temperature Range (°C)
LCD Mode
Operation
Available Packages
2
2
See Tabl e 23 for package information.
FLASH RAM
Auto
S9S08LG32J0CLK 32 KB 1984 -40 °C to +85 °C Charge Pump 80-pin LQFP
S9S08LG32J0CLH 64-pin LQFP
S9S08LG32J0CLF 48-pin LQFP
S9S08LG32J0VLK 32 KB 1984 -40 °C to +105 °C Register Bias 80-pin LQFP
S9S08LG32J0VLH 64-pin LQFP
S9S08LG32J0VLF 48-pin LQFP
S9S08LG16J0VLH 18 KB 1984 64-pin LQFP
S9S08LG16J0VLF 48-pin LQFP
IMM
MC9S08LG32CLK 32 KB 1984 -40 °C to + 85 °C Charge Pump 80-pin LQFP
MC9S08LG32CLH 64-pin LQFP
MC9S08LG32CLF 48-pin LQFP
MC9S08LG16CLH 18 KB 1984 64-pin LQFP
MC9S08LG16CLF 48-pin LQFP