Datasheet

MC9S08QE128 Series Data Sheet, Rev. 7
Electrical Characteristics
Freescale Semiconductor32
Conversion Time
(Including
sample time)
Short Sample (ADLSMP=0) P t
ADC
— 20 — ADCK
cycles
See the ADC
chapter in the
MC9S08QE128
Reference Manual
for conversion time
variances
Long Sample (ADLSMP=1) C — 40 —
Sample Time Short Sample (ADLSMP=0) P t
ADS
— 3.5 — ADCK
cycles
Long Sample (ADLSMP=1) C — 23.5 —
Total Unadjusted
Error
12 bit mode T E
TUE
— ±3.0 — LSB
2
Includes
Quantization
10 bit mode P — ±1 ±2.5
8 bit mode T — ±0.5 ±1.0
Differential
Non-Linearity
12 bit mode T DNL — ±1.75 — LSB
2
10 bit mode
3
P—±0.5 ±1.0
8 bit mode
3
T—±0.3 ±0.5
Integral
Non-Linearity
12 bit mode T INL — ±1.5 — LSB
2
10 bit mode T — ±0.5 ±1.0
8 bit mode T — ±0.3 ±0.5
Zero-Scale Error 12 bit mode T E
ZS
— ±1.5 — LSB
2
V
ADIN
= V
SSAD
10 bit mode P — ±0.5 ±1.5
8 bit mode T — ±0.5 ±0.5
Full-Scale Error 12 bit mode T E
FS
— ±1.0 — LSB
2
V
ADIN
= V
DDAD
10 bit mode P — ±0.5 ±1
8 bit mode T — ±0.5 ±0.5
Quantization
Error
12 bit mode D E
Q
—-1 to 0—LSB
2
10 bit mode — — ±0.5
8 bit mode — — ±0.5
Input Leakage
Error
12 bit mode D E
IL
— ±2—LSB
2
Pad leakage
4
* R
AS
10 bit mode — ±0.2 ±4
8 bit mode — ±0.1 ±1.2
Temp Sensor
Slope
-40°C to 25°C D m — 1.646 — mV/°C
25°C to 85°C — 1.769 —
Temp Sensor
Voltage
25°CDV
TEMP25
—701.2— mV
1
Typical values assume V
DDAD
= 3.0V, Temp = 25°C, f
ADCK
=1.0MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2
1 LSB = (V
REFH
- V
REFL
)/2
N
3
Monotonicity and No-Missing-Codes guaranteed in 10 bit and 8 bit modes
4
Based on input pad leakage current. Refer to pad electricals.
Table 18. 12-bit ADC Characteristics (V
REFH
= V
DDAD
, V
REFL
= V
SSAD
) (continued)
Characteristic Conditions C Symb Min Typ
1
Max Unit Comment