Datasheet

Appendix A Electrical Characteristics
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 5
Freescale Semiconductor 287
The susceptibility performance classification is described in Table A-18.
Table A-17. Conducted Susceptibility, EFT/B
Parameter Symbol Conditions
f
OSC
/f
BUS
Result
Amplitude
1
(Min)
1
Data based on qualification test results. Not tested in production.
Unit
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V
CS_EFT
V
DD
= 3.3V
T
A
= +25
o
C
package type
TBD
TBD crystal
TBD bus
ATBD
kV
BTBD
CTBD
DTBD
Table A-18. Susceptibility Performance Classification
Result Performance Criteria
A No failure The MCU performs as designed during and after exposure.
B Self-recovering
failure
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
C Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E Damage The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.