Datasheet

Appendix A Electrical Characteristics
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 5
Freescale Semiconductor 275
Figure A-7. Typical Crystal or Resonator Circuit
Resolution of trimmed DCO output frequency at fixed voltage and
temperature
4
Δf
dco_res_t
— ±0.1 ± 0.2
%f
dco
Total deviation of DCO output from trimmed frequency:
3
At 8MHz over full voltage and temperature range (M Suffix)
— –1.5 to ±0.5 ± 3
At 8MHz over full voltage and temperature rang (C Suffix)
Δf
dco_t
— –1.0 to ±0.5 ± 2
%f
dco
At 8MHz and 3.6V from 0 to 70°C (C Suffix) — ±0.5 ± 1
FLL acquisition time
4,6
t
Acquire
1.5 ms
Long term jitter of DCO output clock (averaged over 2-ms interval)
7
C
Jitter
—0.020.2
%f
dco
1
When ICS is configured for FEE or FBE mode, input clock source must be divisible using RDIV to within the range of 31.25 kHz
to 39.0625 kHz.
2
See crystal or resonator manufacturer’s recommendation.
3
This parameter is characterized and not tested on each device.
4
Proper PC board layout procedures must be followed to achieve specifications.
5
TRIM register at default value (0x80) and FTRIM control bit at default value (0x0).
6
This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or changing
from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the reference,
this specification assumes it is already running.
7
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Bus
.
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V
DD
and V
SS
and variation in crystal oscillator frequency increase the C
Jitter
percentage for a
given interval.
Table A-8. XOSC and ICS Specifications (Temperature Range = –40 to 125°C Ambient)
Characteristic Symbol Min Typ Max Unit
XOSC
EXTAL XTAL
Crystal or Resonator
R
S
C
2
R
F
C
1